2016 IEEE Energy Conversion Congress and Exposition (ECCE) 2016
DOI: 10.1109/ecce.2016.7855049
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Direct-cooled power module with a thick Cu heat spreader featuring a stress-suppressed structure for EV/HEV inverters

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Cited by 11 publications
(4 citation statements)
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“…Minimizing Lpara value for GaN devices is presented in [5]. Moreover, the packaging of the SiC power module by using new materials and cooling structures is presented in [6], [7], respectively. Comparison of using WBG devices for dc-dc converters is implemented in [8].…”
Section: Wide-bandgap Power Semiconductors For Electric Vehiclementioning
confidence: 99%
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“…Minimizing Lpara value for GaN devices is presented in [5]. Moreover, the packaging of the SiC power module by using new materials and cooling structures is presented in [6], [7], respectively. Comparison of using WBG devices for dc-dc converters is implemented in [8].…”
Section: Wide-bandgap Power Semiconductors For Electric Vehiclementioning
confidence: 99%
“…Low-temperature stress and high fault tolerance of SiC power modules are critical to apply immediately in hybrid EV which can operate with a single cooling loop (temperature > 105°C). To lower down temperature stress and improve reliability for fault tolerance of modules, it is necessary to use new materials and cooling structures to reduce overall thermal resistance (Rth), such as: using thick Cu heat spreader [6], double-sided direct-cooling technology [7]. To improve reliability for fault tolerance, it is necessary to lower down device ON-state resistance and switching loop Lpara of the packaging [9].…”
Section: The Packaging Of Sic Power Modulesmentioning
confidence: 99%
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“…For example, Numakura et al developed a power module cooling system with a Cu heat spreader that can reduce thermal resistance by 34%. 1 Solder is commonly used to integrate devices and heat spreaders; however, the solder-bonding layer limits the heat dissipation because of its low thermal conductivity (20-100 W/m•K at 300 K). Moreover, the soldering process requires high bonding temperature that can damage temperature-sensitive devices such as optical devices.…”
mentioning
confidence: 99%