2013
DOI: 10.1111/jace.12354
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Direct Control of Defects on Positron Lifetimes and Dielectric Constant of Microwave Ceramics

Abstract: It is of great importance to discover completely the correlation between the defects and positron lifetimes in positron annihilation technology (PAT) and reveal clearly the effect of defects on the dielectric constant of universal microwave ceramics. In this work, ZnNb2−xTixO6−x (0 ≤ x ≤ 0.5) dielectric ceramics with nonstoichiometric defects were prepared by solid‐state reaction. All the pores and defects in as‐prepared ceramics were accurately revealed by PAT as a convenient way. The positron lifetimes of τ3… Show more

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Cited by 17 publications
(4 citation statements)
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“…Recently, Deng et al 8 suggested that the Nb addition was effective in enhancing the d-d interactions by Positron Annihilation Techniques (PAT). The defects of the ZnNb 2−x Ti x O 6−x ceramics could be also investigated by PAT 9 . The PALS of TiAl alloys had been analyzed 10 .…”
Section: Introductionmentioning
confidence: 99%
“…Recently, Deng et al 8 suggested that the Nb addition was effective in enhancing the d-d interactions by Positron Annihilation Techniques (PAT). The defects of the ZnNb 2−x Ti x O 6−x ceramics could be also investigated by PAT 9 . The PALS of TiAl alloys had been analyzed 10 .…”
Section: Introductionmentioning
confidence: 99%
“…Hence, the dielectric loss of the composite would increase quickly with an increasing conductive phase near the percolation threshold due to the formation of a conducting path and current leakage. 12,17,18 It is well known that the current leakage is not only related to the charge concentration but is also related to the charge mobility. Hence, restraining the migration of charge carriers by some methods, such as increasing the barrier layer (phase interface 19 ) inside and separating the conductive particles by a non-magnetic low-conductive layer, may be important and impressive ways to decrease the current leakage and dielectric loss.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, PALS offer the annihilation information in lattice and defective region, which presents the characteristics of lattice and defect, such as the electrons density, defect type and defect concentration in solid qualitatively. According to multichannel positron trapping model, at least three independent components including three diverse lifetimes of positron (two for positron trapping and one for o-Ps decaying) as well as their corresponding intensities, which denote the quantity of defect can be acquired in the resolved PALS [36].…”
Section: Pals Analysismentioning
confidence: 99%