Atomically thin two-dimensional (2D) materials have shown great potential for applications in nanoscale electronic and optical devices. A fundamental property of these 2D flakes that needs to be well characterized is the thermal expansion coefficient (TEC), which is instrumental to the dry transfer process and thermal management of 2D material-based devices. Yet, most of current studies of 2D materials' TEC extensively rely on simulations due to the difficulty of performing experimental measurements on an atomically thin, micron-sized, and optically transparent 2D flake. In this work, we present a three-substrate approach to characterize the TEC of monolayer molybdenum disulfide (MoS 2 ) using micro-Raman spectroscopy. The temperature dependence of the Raman peak shift was characterized with three different substrate conditions, from which the in-plane TEC of monolayer MoS 2 was extracted based on lattice symmetries. Independently from two different phonon modes of MoS 2 , we measured the in-plane TECs as (7.6±0.9)×10 -6 1/K and (7.4±0.5)×10 -6 1/K, respectively, which are in good agreement with previously reported values based on first principle calculations. Our work is not only useful for thermal mismatch reduction during material transfer or device operation, but provides a general experimental method that does not rely on simulations to study key properties of 2D materials.