2022
DOI: 10.1002/aenm.202202076
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Diode Factor in Solar Cells with Metastable Defects and Back Contact Recombination

Abstract: To achieve a high fill factor, a small diode factor close to 1 is essential. The optical diode factor determined by photoluminescence is the diode factor from the neutral zone of the solar cell and thus a lower bound for the diode factor. Due to metastable defects transitions, the optical diode factor is higher than 1 even at low excitation. Here, the influence of the backside recombination and the doping level on the optical diode factor are studied. First, photoluminescence and solar cell capacitance simulat… Show more

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Cited by 11 publications
(18 citation statements)
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“…The band gap determination is further hampered by band gap gradients along the depth of the sample, which are often intentional to reduce interface recombination. 27–31 Similar to tail states, these gradients broaden the absorption onset. If the absorptance spectrum is known, the radiative qFls rad can be determined, using eqn (3).…”
Section: Systematic Errors In Quasi Fermi Level Splitting Measurementsmentioning
confidence: 97%
“…The band gap determination is further hampered by band gap gradients along the depth of the sample, which are often intentional to reduce interface recombination. 27–31 Similar to tail states, these gradients broaden the absorption onset. If the absorptance spectrum is known, the radiative qFls rad can be determined, using eqn (3).…”
Section: Systematic Errors In Quasi Fermi Level Splitting Measurementsmentioning
confidence: 97%
“…Such improvements in carrier lifetime allow us to roughly extract the quasi Fermi level splitting ( qFLs ) of the passivated CIGS absorber by using the method ( Eq. 1 ) recently reported by Siebentritt et al [ 48 50 ], …”
Section: Resultsmentioning
confidence: 83%
“…We have recently shown quantitatively that a Ga gradient reduces the backside recombination as effectively as a dielectric layer [150]: both increase the quasi-Fermi level splitting by almost 50 meV for a mediocre absorber with a bulk lifetime of 40 ns. In a good absorber with a lifetime of 200 ns [151] the improvement increases to 80 meV [150]. These experiments and simulations were performed with rather thick absorbers of 3 μm thickness.…”
Section: Back Contact Passivationmentioning
confidence: 99%