Digital sinusoidal fringe pattern generation: Defocusing binary patterns VS focusing sinusoidal patterns

Lei, Shuangyan; Zhang, Song

doi:10.1016/j.optlaseng.2009.12.002

Cited by 109 publications

(65 citation statements)

References 17 publications

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“…In [15] the authors demonstrate that the phase error is generally lower with a defocused binary pattern than with a focused sinusoidal one. In the case where high sensitivity is sought, small apertures are acceptable and above all with grayscale fringe patterns, this alternative is undoubtedly to be considered.…”

Section: Fringe Projection and Phase Computationmentioning

confidence: 96%

Snap-shot profilometry with the Empirical Mode Decomposition and a 3-layer color sensor

2011

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Remote sensing finds more and more applications, from industrial control, to face recognition, not forgetting terrain surveying. This trend is well exemplified by fringe projection techniques, which enjoyed a considerable development in the recent years. In addition of high requirement in terms of measurement accuracy and spatial resolution, the end-users of full-field techniques show a growing interest for dynamic regimes. We report here what we believe to be the use for the first time of a CMOS 3-layer color sensor (Foveon X3) as the key element of a RGB fringe projection system, together with the processing specifically elaborated for this sensor. The 3-layer architecture allows the simultaneous recording of three phase-shifted fringe patterns and features the precious asset of an unambiguous relationship between the physical sensor pixel and the picture pixel and this for each color layer, on the contrary of common color sensor arrays (Bayer mosaic and tri-CCD). Due to the overlapping of the spectral responses of the layers, color transformation is mandatory to achieve the separation of the three phase-shifted RGB projected fringe patterns. In addition, we propose the use of the Empirical Mode Decomposition to equalize the non-uniform responses of the three layers. Although the conversion of the phase into a height is of primary importance in an actual measurement, it is not treated here, the literature being profuse on the central projection model. 6. P. Groot, "Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window," Appl. Opt. 34(22), 4723-4730 (1995). 7. D. W. Phillion, "General methods for generating phase-shifting interferometry algorithms," Appl. Opt. 36(31), 8098-8115 (1997). 8. Y. Surrel, "Design of algorithms for phase measurements by the use of phase stepping," Appl. Opt. 35(1), 51-60 (1996). 9. J. Novak, P. Novak, and A. Miks, "Multi-step phase-shifting algorithms insensitive to linear phase shift errors," ©2011 Optical Society of AmericaOpt. Commun. 281(21), 5302-5309 (2008). 10. X. Colonna de Lega, and P. Jacquot, "Deformation measurement with object-induced dynamic phase shifting," Appl. Opt. 35(25), 5115-5121 (1996). 11. C. Wust, and D. W. Capson, "Surface profile measurement using color fringe projection," Mach. Vis. Appl. 4(3), 193-203 (1991 550-558 (2010). 22. S. Equis, and P. Jacquot, "The empirical mode decomposition: a must-have tool in speckle interferometry?" Opt.Express 17(2), 611-623 (2009). 23. H. A. Aebischer, and S. Waldner, "Simple and effective method for filtering speckle interferometric phase fringe patterns," Opt. Commun. 162(4-6), 205-210 (1999).

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Section: Fringe Projection and Phase Computationmentioning

confidence: 96%

Snap-shot profilometry with the Empirical Mode Decomposition and a 3-layer color sensor

2011

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“…In [11] illumination defocus is exploited towards a different end. Sinusoidal patterns are generated by projecting binary patterns with a defocused projector.…”

Section: Related Workmentioning

confidence: 99%

Multi Focus Structured Light for Recovering Scene Shape and Global Illumination

Achar

Narasimhan

2014

Computer Vision – ECCV 2014

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Abstract. Illumination defocus and global illumination effects are major challenges for active illumination scene recovery algorithms. Illumination defocus limits the working volume of projector-camera systems and global illumination can induce large errors in shape estimates. In this paper, we develop an algorithm for scene recovery in the presence of both defocus and global light transport effects such as interreflections and sub-surface scattering. Our method extends the working volume by using structured light patterns at multiple projector focus settings. A careful characterization of projector blur allows us to decode even partially out-of-focus patterns. This enables our algorithm to recover scene shape and the direct and global illumination components over a large depth of field while still using a relatively small number of images (typically 25-30). We demonstrate the effectiveness of our approach by recovering high quality depth maps of scenes containing objects made of optically challenging materials such as wax, marble, soap, colored glass and translucent plastic.

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“…This technique is called the binary defocusing technique. The binary defocusing technique has many potential advantages: (1) no requirement for gamma calibration since only two grayscale values are used [9], (2) no strict requirement for camera exposure time even when the digital-light-processing (DLP) projector is utilized [10], and (3) possibilities of achieving unprecedentedly high-speed 3D shape measurement [11]. However, the binary defocusing technique is not trouble-free, especially when the fringe stripes are wide where the high-order harmonics cannot be effectively suppressed by defocusing due to the limitation of the projector lens [4].…”

Section: Binary Dithering Techniquementioning

confidence: 99%

Three-dimensional shape measurement with binary dithered patterns

2012

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The previously proposed binary defocusing technique and its variations have proven successful for highquality three-dimensional (3D) shape measurement when fringe stripes are relatively narrow, but they suffer if fringe stripes are wide. This paper proposes to utilize the binary dithering technique to conquer this challenge. Both simulation and experimental results show the phase error is always less than 0.6% even when the fringe stripes are wide and the projector is nearly focused. Disciplines Computer-Aided Engineering and Design | Mechanical Engineering CommentsThis article is from Applied Optics 51 (2012) The previously proposed binary defocusing technique and its variations have proven successful for high-quality three-dimensional (3D) shape measurement when fringe stripes are relatively narrow, but they suffer if fringe stripes are wide. This paper proposes to utilize the binary dithering technique to conquer this challenge. Both simulation and experimental results show the phase error is always less than 0.6% even when the fringe stripes are wide and the projector is nearly focused.

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Digital sinusoidal fringe pattern generation: Defocusing binary patterns VS focusing sinusoidal patterns

Cited by 109 publications

References 17 publications

Snap-shot profilometry with the Empirical Mode Decomposition and a 3-layer color sensor

Snap-shot profilometry with the Empirical Mode Decomposition and a 3-layer color sensor

Multi Focus Structured Light for Recovering Scene Shape and Global Illumination

Three-dimensional shape measurement with binary dithered patterns

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