2000
DOI: 10.1103/physrevlett.84.2441
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Diffusion of Ge below the Si(100) Surface: Theory and Experiment

Abstract: We have studied diffusion of Ge into subsurface layers of Si(100). Auger electron diffraction measurements show Ge in the fourth layer after submonolayer growth at temperatures as low as 500 degrees C. Density functional theory predictions of equilibrium Ge subsurface distributions are consistent with the measurements. We identify a surprisingly low energy pathway resulting from low interstitial formation energy in the third and fourth layers. Doping significantly affects the formation energy, suggesting that … Show more

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Cited by 82 publications
(84 citation statements)
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References 26 publications
(28 reference statements)
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“…Although v 0 can be determined more exactly if required, 27 it is common practice to use a fixed preexponential factor of the order of 10 13 . 26,28 This value agrees with calculations done for single atom hops of Ag on a ZnO substrate showing that the pre-factors are typically between 0.3 Â 10 13 and 14 Â 10 13 . The reasoning for using a fixed value is that a more exact value can be very computational expensive to determine and the frequency of events from the Arrhenius equation depends more strongly on the value of E B than v 0 .…”
Section: A Akmcsupporting
confidence: 78%
“…Although v 0 can be determined more exactly if required, 27 it is common practice to use a fixed preexponential factor of the order of 10 13 . 26,28 This value agrees with calculations done for single atom hops of Ag on a ZnO substrate showing that the pre-factors are typically between 0.3 Â 10 13 and 14 Â 10 13 . The reasoning for using a fixed value is that a more exact value can be very computational expensive to determine and the frequency of events from the Arrhenius equation depends more strongly on the value of E B than v 0 .…”
Section: A Akmcsupporting
confidence: 78%
“…As such, the M ϫ N patch structure is described as an M ϫ 4 layer atop a 4 ϫ N layer, for which the upper layer does not fill in the preceding layer DVLs. Moreover, recent work 24,25 indicates that nontrivial intermixing is expected to occur across the Ge-Si interface.…”
Section: Introductionmentioning
confidence: 99%
“…The fourth contribution comes from the entropic term and favours alloying. As demonstrated by ab initio calculations [32,33], all mechanisms of atomic exchange responsible for intermixing are possible only within the first few atomic layers at the surface. In the bulk below, the activation barriers for atomic motions are too high and bulk diffusion is hindered.…”
Section: Intermixingmentioning
confidence: 99%
“…the MBE beam) and redistribution of atoms by diffusion along the surface. Bulk processes can be considered to play no role due to their higher activation barrier [32,58].…”
Section: Evolution Lawmentioning
confidence: 99%
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