2002
DOI: 10.12693/aphyspola.102.57
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Diffraction Studies of Nanocrystals: Theory and Experiment

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Cited by 42 publications
(44 citation statements)
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“…However, based on crystallographic assumptions, the applicability of such method to small nanoparticles is questionable and likely to be semiquantitative at best. Palosz et al [60] have shown that the conventional tools developed for elaboration of powder diffraction data are not directly applicable to nanocrystals. [60] The atomic PDF, G(r), is based on the total scattering experiment where both Bragg and diffuse scattering signals are utilised to obtain structural information at different atomic scales.…”
Section: Resultsmentioning
confidence: 99%
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“…However, based on crystallographic assumptions, the applicability of such method to small nanoparticles is questionable and likely to be semiquantitative at best. Palosz et al [60] have shown that the conventional tools developed for elaboration of powder diffraction data are not directly applicable to nanocrystals. [60] The atomic PDF, G(r), is based on the total scattering experiment where both Bragg and diffuse scattering signals are utilised to obtain structural information at different atomic scales.…”
Section: Resultsmentioning
confidence: 99%
“…Palosz et al [60] have shown that the conventional tools developed for elaboration of powder diffraction data are not directly applicable to nanocrystals. [60] The atomic PDF, G(r), is based on the total scattering experiment where both Bragg and diffuse scattering signals are utilised to obtain structural information at different atomic scales. Structural information can be extracted from the measured PDFs data using a fullprofile real-space local structure refinement method, [58] using the program PDFgui.…”
Section: Resultsmentioning
confidence: 99%
“…For these smallest crystals it was difficult to assess concentration of dislocations. Dislocation concentration was very low, less than the sensitivity limit, 10 13 m −2 . The full width at half maximum ͑FWHM͒ of experimental line profiles for sample A are plotted in Fig.…”
Section: Resultsmentioning
confidence: 81%
“…These features can be used for identification and evaluation of the surface structure: ͑i͒ relative difference between alp values measured at low and large Q is a measure of thickness of the shell and strain at the grain surface; ͑ii͒ the alp values measured at very large Q tend to approach the value of the lattice parameter in the grain core; ͑iii͒ "jumps" of alp values calculated for individual reflections are caused by anisotropy of the grain shapes. [9][10][11] The concept of alp has recently been used to analyze strains in nanocrystalline SiC powders. …”
Section: B Alp Analysismentioning
confidence: 99%
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