Diffraction patterns of stacked layer crystals

Estévez-Rams, E.; Aragón-Fernández, B.; Fueß, H.; Pentón-Madrigal, A.

doi:10.1103/physrevb.68.064111

Cited by 14 publications

(11 citation statements)

References 24 publications

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“…In was shown that from the diffraction data it is possible to obtain the Fourier coefficients of there functions and, therefore, calculate the respective probabilities. This idea was further developed in [18,19].…”

Section: Direct Solution Of the Diffraction Pattern Of The Crystal Wimentioning

confidence: 99%

X-ray scattering on one-dimensional disordered structures

Cherepanova

2012

J Struct Chem

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The review shows different treatments and methods for the analysis of the X-ray diffraction patterns from the crystals disordered in one direction; the possibilities, limitations, and applications of each method are discussed. The author also provides the examples of simulation of the diffraction patterns for the crystals, which have the effects on the experimental X-ray patterns related with 1D disordering. Several structural types and different kinds of one-dimensional disorder are considered.

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Section: Direct Solution Of the Diffraction Pattern Of The Crystal Wimentioning

confidence: 99%

X-ray scattering on one-dimensional disordered structures

Cherepanova

2012

J Struct Chem

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“…The reader is referred to [6] for further discussion on the limitations of Warren formalism. The relation between the formalism explained in this section and other approaches is further discussed in [14].…”

Section: Introductionmentioning

confidence: 98%

“…It has been discussed [14] that each peak profile contribution on the A ∆ and B ∆ coefficients can be described as "Decay term" x "Oscillating term"…”

Section: Introductionmentioning

confidence: 99%

“…The correlation length is a useful parameter for comparing planar disordered structures with different stacking fault nature. The correlation length gives a characteristic length over which the predictability of the occurrence of a particular layer type is lost [14]. Therefore is a quantitative measure of planar disorder without regard of the origin of the stacking disorder.…”

Section: Introductionmentioning

confidence: 99%

“…The diffraction pattern of a layer structured crystal can be represented in the general case as a Fourier series [14] ( )…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals

Estévez-Rams¹,

Pentón

Martinez-Garcia

et al. 2004

Cryst. Res. Technol.

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The implication of the use of particular peak profile functions in the fit of diffraction data on the nature and density of stacking faults in layered solids is studied. Common type of profile functions are studied: Gauss, Lorentz, pseudoVoigt and Pearson VII. An additional peak profile is introduced. For each profile function the decaying term of the probability correlation function is determined and the expression for the correlation length is deduced. The form of the asymmetric component of each profile is also reported. Experimental data is fitted using each profile and the results are discussed.

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Detailed study of defects in thin fullerite films

Graivoronska

Klimenkov

Solonin

et al. 2012

Cryst. Res. Technol.

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The structural investigations of fullerite films were performed using high-resolution electron microscopy, electron diffraction and electron energy loss spectroscopy and X-ray photoelectron spectroscopy. In particular defects such as dislocations, stacking faults and twins were studied in details. It was shown that fullerite films could be characterized by a face-centered cubic (f.c.c.) structure with lattice parameter a = 1.416 nm. They are distinguished for their rich polytypic structure that is caused by breaking of alteration of closely packed planes of (111) type. The quantitative method based on information theory using the "run-length encoding" algorithm was suggested to evaluate the degree of disorder in the f.c.c structure of thin fullerite films.

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Diffraction patterns of stacked layer crystals

Cited by 14 publications

References 24 publications

X-ray scattering on one-dimensional disordered structures

X-ray scattering on one-dimensional disordered structures

The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals

Detailed study of defects in thin fullerite films

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