Diffraction-anomalous-fine-structure spectroscopy applied to the study of III-V strained semiconductors

Proietti, Maria Grazia; Renevier, H.; Hodeau, Jean-Louis; García, J.; Bérar, J. F.; Wolfers, P.

doi:10.1103/physrevb.59.5479

Cited by 66 publications

(72 citation statements)

References 31 publications

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“…However, for all of them, the information is averaged over all the orientations of atoms in crystals. In principle, non-forbidden re¯ections in the XANES region (Templeton &Templeton, 1980, 1985, andreferences therein) and in the DAFS region (Stragier et al, 1992;Proetti et al, 1999) give information about non-averaged local atomic con®gurations. However, all the atoms, affected and not affected by impurities, give their contribution to the diffraction spectra.…”

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confidence: 99%

Resonant X-ray diffraction: `forbidden' Bragg reflections induced by thermal vibrations and point defects

Дмитриенко

Овчинникова

2000

Acta Cryst Sect A

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In general, the local atomic environment becomes less symmetric owing to point defects and thermal vibrations of atoms in crystals. It is shown that, as a result of this phenomenon, an additional anisotropy of the resonant scattering factors can occur and the forbidden Bragg re¯ections can be excited near absorption edges. Examples of crystals are presented (Ge, K 2 CrO 4 , C-15 type) where such thermal-motion-induced (TMI) and point-defect-induced (PDI) re¯ections can be observed. The tensor structure factors of both types of re¯ection are computed. Owing to their resonant character, the PDI re¯ections allow both impurity atoms and host atoms of different types to be studied separately. The considered phenomena can provide a very sensitive method to study point defects because only the atoms distorted by defects produce contributions to the PDI re¯ections.

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confidence: 99%

Resonant X-ray diffraction: `forbidden' Bragg reflections induced by thermal vibrations and point defects

Дмитриенко

Овчинникова

2000

Acta Cryst Sect A

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“…We want also to point out, without entering in details (for EDAFS data analysis see reference [Proietti et al, 1999]) (004) and (006) reflections of InAs at the As K-edge. Calculations are done at the As K-edge (11.867 keV) and do not take into account the Debye-Waller factors (M=0).…”

Section: ′′mentioning

confidence: 99%

“…• that a proper choice of the Bragg reflection can also help to minimize distortions to the Extended-DAFS oscillations induced by absorption. The structure factor F ( Q, E) can be split into its smooth and oscillatory parts, as in equation 5 in reference [Proietti et al, 1999]. The oscillatory behaviour of A( − → Q , E) propagates into the DAFS oscillations leading to distortions whose strength depends on the relative amplitude of the absorption oscillations compared to the amplitude of the DAFS oscillations.…”

Section: ′′mentioning

confidence: 99%

“…For the sake of clarity, consider a centrosymmetric, periodic structure (the general case is considered in references [Meyer et al, 1998, Proietti et al, 1999). The scattering structure factor is…”

Section: Selectivitymentioning

confidence: 99%

“…The reader can find extensive information about DAFS and anomalous diffraction in the review articles by Sorensen et al [Sorensen et al, 1994] and more recently by Hodeau et al [Hodeau et al, 2001]. The article by Proietti et al [Proietti et al, 1999] develops the analysis of the Extented-DAFS (EDAFS), i.e. the portion of the DAFS spectrum above the absorption energy.…”

Section: Introductionmentioning

confidence: 99%

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Diffraction anomalous fine-structure spectroscopy at beamline BM2 at the European Synchrotron Radiation Facility

Renevier

Grenier

Arnaud

et al. 2003

J Synchrotron Radiat

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Diffraction Anomalous Fine Structure (DAFS) spectroscopy uses resonant elastic x-rays scattering as an atomic, shell and site selective probe that gives information on the electronic structure and the local atomic environment as well as on the long range ordered crystallographic structure. A DAFS experiment consists of measuring the Bragg peak intensities as a function of the energy of the incoming x-ray beam. The French CRG (Collaborative Research Group) beamline BM2-D2AM (Diffraction Diffusion Anomale Multi-longueurs d'onde) at the ESRF (European Synchrotron Radiation Facility) has developed a state of the art energy scan diffraction set-up. In this article, we present the requirements for obtaining reliable DAFS data and report recent technical achievements.

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XAS Spectroscopy: Related Techniques and Combination with Other Spectroscopic and Scattering Methods

Lamberti

Borfecchia

Bokhoven

et al. 2016

X‐Ray Absorption and X‐Ray Emission Spectroscopy

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Diffraction-anomalous-fine-structure spectroscopy applied to the study of III-V strained semiconductors

Cited by 66 publications

References 31 publications

Resonant X-ray diffraction: `forbidden' Bragg reflections induced by thermal vibrations and point defects

Resonant X-ray diffraction: `forbidden' Bragg reflections induced by thermal vibrations and point defects

Diffraction anomalous fine-structure spectroscopy at beamline BM2 at the European Synchrotron Radiation Facility

XAS Spectroscopy: Related Techniques and Combination with Other Spectroscopic and Scattering Methods

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