Abstract:Electron diffraction patterns and images of three-dimensional (3D) objects are limited by the range of specimen tilt angles. This range is commonly limited by the specimen holder, but for angles >60°, the slab-like nature of most specimens is itself a fundamental limitation. At 60° the beam path is twice the thickness of the untilted specimen, at 70° it is three times, and at 90° it is infinite. For angles > ± 60°, the information is severely degraded or unattainable This causes serious problems for elec… Show more
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