Dielectric loss of LiD doped with Mg2+

Abstract

The dielectric relaxation of LiD containing Mg2+ impurity has been investigated by the dielectric loss method. Two peaks have been observed at the dielectric loss curve which are attributed to the pairs of the substitutional impurity with the first neighbour vacancy and with the second neighbour vacancy. The plots of In fm (fm being the peak frequency) vs. 1/T are found to be straight lines for both the peaks and yield 0.43 and 0.71 eV as the values for activation energies for the high and the low frequency peaks, respectively. The experimental results are not consistent with Dreyfus' model.