1996
DOI: 10.1063/1.362975
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Dielectric function and reflectivity of 3C–silicon carbide and the component perpendicular to the c axis of 6H–silicon carbide in the energy region 1.5–9.5 eV

Abstract: The optical properties of commercially available 3C- and 6H-SiC single crystals were studied in the energy region 1.5–9.5 eV with conventional and synchrotron-radiation spectroscopic ellipsometry. The surface perfection of the materials was investigated by transmission electron and atomic force microscopies. The calculated values for the effective and static dielectric functions were higher than those found in the literature. This is consistent with the fine structure and absolute values of the corresponding r… Show more

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Cited by 81 publications
(22 citation statements)
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“…40 A shoulder around 6 eV (R 40%) and a peak at 7-8 eV (R ≤ 60% with PBE and F10LYP, R > 80% with F15LYP) are found with the coupled-perturbed calculation, also in agreement with the latter reference (R = 40% at 6 eV and R 60% at 7.8 eV).…”
Section: R(ω)supporting
confidence: 74%
“…40 A shoulder around 6 eV (R 40%) and a peak at 7-8 eV (R ≤ 60% with PBE and F10LYP, R > 80% with F15LYP) are found with the coupled-perturbed calculation, also in agreement with the latter reference (R = 40% at 6 eV and R 60% at 7.8 eV).…”
Section: R(ω)supporting
confidence: 74%
“…50 These values are close to the experimental values, 9.72 67 and 10.13. 68 In summary, according to the approximations and the error estimations given above, the error in the formation energy for each defect may sum up to be less than 0.1 eV if the charge density related to the defect is well localized. In the HSE0.15 results, most stable defects correspond to this case, except for the 3+ to 0 charge states of Si TC and 1+ and 0 charge states of V C .…”
Section: E Defect Formation Energymentioning
confidence: 99%
“…7 we show the BSE spectrum computed for a 8 × 8 × 8 shifted k-point mesh and the experimental curve from Ref. 44 . Overall the agreement between theory and experiment is good and the main peak position is reproduced with an error of about 0.15 eV.…”
Section: Applications To Bulk Silicon Carbon Diamond and Siliconmentioning
confidence: 99%