Dielectric constant measurements using printed circuit techniques at microwave frequencies

Kantor, Y.

doi:10.1109/melcon.1998.692348

Cited by 7 publications

(4 citation statements)

References 9 publications

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“…A number of methods [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16] are available for measuring the dielectric constant of a slab/sheet/laminate substrate material at microwave frequencies. These may be classified as either nondestructive or destructive methods.…”

Section: Previous Workmentioning

confidence: 99%

“…Slawomir and Zaradny [12] have measured dielectric constant of a microwave laminate using symmetricstrip-transmission line technique with accuracy less than 3%. Yehuda Kantor [13] has presented three methods-microstrip resonator, stripline resonator and closed disk resonator to determine dielectric constant of laminates having thickness of 0.2 -3mm with dielectric constant varying from 2 to 20. Du Shimin [14] has presented a method of measuring dielectric constant of a thin slab material using resonance frequency of a microstrip patch antenna.…”

Section: Previous Workmentioning

confidence: 99%

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Nondestructive method for measuring dielectric constant of sheet materials

Mathur¹,

Bhatnagar²,

Sahula³

2011

TENCON 2011 - 2011 IEEE Region 10 Conference

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In many applications including RF, Microwave dielectric constant (ε r ) of the material is a key design parameter. Present methods for measurement of ε r are time-consuming and require a sample piece of the material on which some processing has to be done (destructive methods). This paper presents a nondestructive and simple method for determining ε r of sheet dielectric materials. The method is nondestructive in the sense that cutting of the material or any processing on it is not required. In this method resonant frequency ( f r ) of a pre-fabricated antenna is first measured with a known material and then again measured with the Material Under Test (MUT) as dielectric part of the microstrip antenna. The parameter ε r is then determined from the ratio of these resonant frequencies and the thickness of MUT. The experimentation is arranged so that errors due to measurement in patch dimensions and electrical connections to the feed line are eliminated. The method can be used for on-line quality control during production of dielectric sheets. An aperture coupled microstrip antenna has been designed and fabricated with f r = 8.4 GHz. A simple jig has been constructed to hold the antenna and connecting cable. It provides an easy means for changing the MUT and brings different areas under the patch. Measurements validate the design and simulation results.

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Section: Previous Workmentioning

confidence: 99%

Section: Previous Workmentioning

confidence: 99%

Nondestructive method for measuring dielectric constant of sheet materials

Mathur¹,

Bhatnagar²,

Sahula³

2011

TENCON 2011 - 2011 IEEE Region 10 Conference

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“…For example, test procedures utilizing a lumped element are limited to the frequency range below 1 GHz [1] while those based on microwave cavities, or microstrip resonators require rather large samples [2][3][4]. In the resonant techniques, the radiation losses and non-optimized coupling conditions are common sources of errors in the measured permittivity.…”

Section: Introductionmentioning

confidence: 99%

TDR permittivity measurements of dielectric films

Obrzut

Nozaki

2006

2006 IEEE Instrumentation and Measurement Technology Conference Proceedings

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specimen short termination l t d =3.0 mm D=7.0 mm reference plane specimen short termination l t d =3.0 mm D=7.0 mm reference plane Fig.Abstract -We describe a time-domain reflectometry (TDR) technique to measure the dielectric permittivity of film materials with enhanced dielectric constant. The test specimen consists of a planar capacitor terminating coaxial waveguide. The complex permittivity is obtained from analysis of the incident and the reflected voltage waves. In order to improve accuracy at higher frequencies, we introduced a propagation term correcting the lumped element model. The applicability of the method has been verified at frequencies from 100 MHz to 10 GHz on several polymer composite films, 8 m to 100 m thick, having a dielectric constant ranging from 3.5 to 40. When compared to other techniques, TDR provides a more intuitive and direct insight into capacitance density and impedance characteristics, which is useful in high-frequency characterization of materials for embedded capacitance applications.

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“…Furthermore, challenges arise in the measurement of thin materials (1-3 mm) employed in the packaging technology, where uncertainties in the material thickness would result in uncertainties in the permittivity that can be extracted. In particular, the need for a real-time extraction of the complex permittivity of thin packaging substrates over broadband remains a practical concern faced by the microelectronics industry, which has been little addressed by available literature [1][2][3].…”

Section: Introductionmentioning

confidence: 99%

Improved and fast extraction of dielectric parameters of thin organic packaging materials using open-ended coaxial line technique

Lim

Rotaru²,

Alphones³

et al.

Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)

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In this work the open-ended coaxial line technique is analyzed and improved. A lumped equivalent model is proposed. The interaction between the probe, material under test (MUT) and the backing of the MUT is studied and the sample hacking was found to have a strong effect over the measured results, especially over high frequencies. In this paper we use an optimum dielectric backing for accurate extraction of the complex permittivity of thin packaging materials. A frequency dependent term was also included in the lumped circuit model to account for variations of the static capacitance with increasing frequency for a given coaxial line dimension. In addition, an error network was incorporated for convenient probe calibration. The validity and accuracy df the model is verified through numerical modeling and high frequency measurements. In addition the effects of the testing environment on the dielectric properties were also investigated for a few FR4 substrates over a broad frequency band and the results are reported here.

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Dielectric constant measurements using printed circuit techniques at microwave frequencies

Cited by 7 publications

References 9 publications

Nondestructive method for measuring dielectric constant of sheet materials

Nondestructive method for measuring dielectric constant of sheet materials

TDR permittivity measurements of dielectric films

Improved and fast extraction of dielectric parameters of thin organic packaging materials using open-ended coaxial line technique

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