Abstract:specimen short termination l t d =3.0 mm D=7.0 mm reference plane specimen short termination l t d =3.0 mm D=7.0 mm reference plane Fig.Abstract -We describe a time-domain reflectometry (TDR) technique to measure the dielectric permittivity of film materials with enhanced dielectric constant. The test specimen consists of a planar capacitor terminating coaxial waveguide. The complex permittivity is obtained from analysis of the incident and the reflected voltage waves. In order to improve accuracy at higher fr… Show more
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