2022
DOI: 10.1080/00150193.2022.2041930
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Dielectric and pyroelectric properties of AlN single-crystal layers grown by chloride-hydride epitaxy

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“…In this case, the heat flux impact causes charge shifts in adjacent layers towards each other and the recorded resultant pyroelectric current is a result of subtraction of the induced current of each sublayer, rather than of addition. A similar approach for multilayer nitride structures was used to explain significant reduction of pyroelectric coefficient in a three-layer aluminum nitride structure grown directly on SiC/(111)Si substrate [26].…”
Section: Resultsmentioning
confidence: 99%
“…In this case, the heat flux impact causes charge shifts in adjacent layers towards each other and the recorded resultant pyroelectric current is a result of subtraction of the induced current of each sublayer, rather than of addition. A similar approach for multilayer nitride structures was used to explain significant reduction of pyroelectric coefficient in a three-layer aluminum nitride structure grown directly on SiC/(111)Si substrate [26].…”
Section: Resultsmentioning
confidence: 99%