2014 IEEE International Reliability Physics Symposium 2014
DOI: 10.1109/irps.2014.6860595
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Diagnosing bias runaway in analog/mixed signal circuits

Ketul B. Sutaria
1
,
Pengpeng Ren
2
,
Athul Ramkumar
3
et al.
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Cited by 8 publications
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Adaptive accelerated aging with 28nm HKMG technology

Reza
1
,
Hassan
2
,
Katoozi
3
et al. 2017
2017 IEEE International Reliability Physics Symposium (IRPS)
2
0
0
0
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Adaptive accelerated aging with 28nm HKMG technology

Reza
1
,
Hassan
2
,
Katoozi
3
et al. 2017
2017 IEEE International Reliability Physics Symposium (IRPS)
2
0
0
0
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Design of aging aware 5 Gbps LVDS transmitter for automotive applications

Jagannathan1,
Abhishek2,
Mahatme3
et al. 2018
2018 IEEE International Reliability Physics Symposium (IRPS)
2
0
0
0
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Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process

Pande
1
,
Park
2
,
Kim
3
et al. 2019
2019 IEEE International Reliability Physics Symposium (IRPS)
4
0
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