Diagnosability in the decomposition approach for fault location in large analog networks

Ozawa, Takao; Salama, A.E.

doi:10.1109/tcs.1985.1085712

Cited by 15 publications

(4 citation statements)

References 1 publication

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“…The chief achievements in this brief include: 1) for any cascade linear circuit, if there is any fault at a subcircuit, the method proposed can be used to detect it, no matter what the fault characteristics are; 2) for any cascade linear circuit, if there are faults simultaneously existing at multiple subcircuits, the stage searching method can generally be used to detect them; 3) compared with other subcircuit fault detection methods [2]- [4], the method proposed has small computation load before and after the testing. There is no restriction for fault characteristics and fault amounts inside the subcircuits; 4) the deficiency of the proposed method is that it only applies to cascade linear circuits.…”

Section: Discussionmentioning

confidence: 99%

Fault detection method for the subcircuits of a cascade linear circuit

Woo

2000

IEEE Trans. Circuits Syst. I

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The fault detection method for the subcircuits of a cascade linear circuit is discussed. While there is any fault (either "hard" or "soft" and either "single" or "multiple") at one subcircuit of a cascade linear circuit, it can be quickly detected by using the method proposed in this brief. While there are faults simultaneously existing at multiple subcircuits, they can generally be detected by the searching approach proposed in this brief. The aforementioned method is the continuation and development of the unified fault detection dictionary method for linear circuits proposed in [1].

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Section: Discussionmentioning

confidence: 99%

Fault detection method for the subcircuits of a cascade linear circuit

Woo

2000

IEEE Trans. Circuits Syst. I

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“…In this section, we shall compare the diagnosability of the intersected-torn search approach compared with the unified decomposition approach [2,3] with some typical circuits. It is emphasized that the latter requires all incident nodes to be accessible, and the former has no such requirement [4].…”

Section: Diagnosability For Some Typical Circuitsmentioning

confidence: 99%

“…According to the matrices D1 and D2 which are formed by the unified decomposition approach in Reference [3], there are some identical column sets in it, such as C, ={s2, S12}, C2 ={S 4, S45}, C3 ={513, S23} and C4 ={534, S35}. Thus, the maximum number of diagnosable faulty sub-networks f should be 1.…”

Section: Diagnosability For Some Typical Circuitsmentioning

confidence: 99%

Fast Logical Location of Faults in Large Analog Electronic Circuits

et al. 2002

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This paper presents a method for fast off-line logical location of faults in analog electronic circuits at the sub-network level and verifies its practical diagnosability. The proposed approach breaks through the previous limitation that all torn terminals (incident nodes) must be accessible and that the mutual-testing method must be utilized to locate the faulty sub-networks. As far as the diagnosability is concerned, its application is more extensive than the unified decomposition approach. Therefore it better satisfies the engineering needs.

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“…During this period, the failure element delimitation method and k-fault diagnosis method are more typical fault diagnosis methods. In 1984, Salama et al introduced the idea of network decomposition in the study of fault diagnosis for large-scale analog circuit, and located the fault to the smallest subnetwork [6], but the tearing characteristic of its relation nodes makes it unfeasible.…”

Section: Introductionmentioning

confidence: 99%

Research on ELM Soft Fault Diagnosis of Analog Circuit Based on KSLPP Feature Extraction

Gan

Meng

et al. 2019

IEEE Access

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In order to improve the capability of soft fault diagnosis in an analog circuit, an integrated diagnosis method based on KSLPP feature extraction and ELM is proposed. The KSLPP feature extraction ability is firstly used to construct the principal component feature set from the fault sample set. Then, the advantage of ELM on solving the complicated nonlinearity problem is applied to build the fault identification model from the principal component feature. Finally, the sample sets of soft fault diagnosis for the analog circuit are respectively established by waveform parameter and wavelet packet transform to conduct the diagnostic test for the built model. The simulation of Elliptic Filter shows that, based on the fault sample set gotten by waveform parameter, the total correct rate of the integrated method is 98.2%; on the basis of the fault sample set built by wavelet packet transform, the total correct rate is 100%. The feasibility and effectiveness of this method are also validated. INDEX TERMS Extreme learning machine, Kernel supervised locality preserving projection, feature extraction, analog circuit, fault diagnosis.

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Diagnosability in the decomposition approach for fault location in large analog networks

Cited by 15 publications

References 1 publication

Fault detection method for the subcircuits of a cascade linear circuit

Fault detection method for the subcircuits of a cascade linear circuit

Fast Logical Location of Faults in Large Analog Electronic Circuits

Research on ELM Soft Fault Diagnosis of Analog Circuit Based on KSLPP Feature Extraction

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