2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) 2013
DOI: 10.1109/pvsc.2013.6744856
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Device comparison of champion nanocrystal-ink based CZTSSe and CIGSSe solar cells: Capacitance spectroscopy

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Cited by 11 publications
(5 citation statements)
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“…The ts-TRPL data have been uniformly scaled in Figure 4b to the measured initial carrier injection Δn t=0 , which allows for determining the free carrier density p 0 ≈ 1.8 × 10 16 cm −3 for CZTSSe. This value is in good agreement with the free carrier density measured by capacitance-voltage profiling on devices measured here (see the Supporting Information) and on equivalently processed CZTSSe devices, [20,43] illustrating the benefit of intensity-dependent TRPL in extracting this parameter for absorbers without the need for device fabrication.…”
Section: Intensity-dependent and Spectrally Resolved Trplsupporting
confidence: 86%
“…The ts-TRPL data have been uniformly scaled in Figure 4b to the measured initial carrier injection Δn t=0 , which allows for determining the free carrier density p 0 ≈ 1.8 × 10 16 cm −3 for CZTSSe. This value is in good agreement with the free carrier density measured by capacitance-voltage profiling on devices measured here (see the Supporting Information) and on equivalently processed CZTSSe devices, [20,43] illustrating the benefit of intensity-dependent TRPL in extracting this parameter for absorbers without the need for device fabrication.…”
Section: Intensity-dependent and Spectrally Resolved Trplsupporting
confidence: 86%
“…Using admittance spectroscopy, we have shown that this deep defect distribution is detrimental for the V oc . 6 Such a signature of the deep defect distribution observed by admittance spectroscopy is not only measured for devices from University of Luxembourg but also in various other literature reports, 7,8 including a 10.1% efficient CZTSSe device, 9 and therefore might be of interest for further studies.…”
Section: Introductionmentioning
confidence: 71%
“…Drive level capacitance profiling (DLCP) and capacitance-voltage (CV) measurements (taken at 25° C) follow the procedures described by Heath et al [23] with measurements taken at 2×10 5 Hz for V AC from 20-380 mV. The relative dielectric of CZTSSe and ACZTSe (5% Ag) is taken to be 8.5ε 0 from previous admittance measurements of nanocrystal based CZTSSe [24]. Minimal light-soaking effects were observed in the capacitance response.…”
Section: Methodsmentioning
confidence: 99%