Device and IC Characterization Above 100 GHz

Yau, K.H.K.; Dacquay, E.; Sarkas, I.

doi:10.1109/mmm.2011.2173869

Cited by 41 publications

(31 citation statements)

References 35 publications

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“…On the other hand, the SOLD and TAD algorithms, respectively, dispense with the use of the fourth and third standard. For expensive processes such as semiconductor or low temperature co-fire ceramic (LTCC), one can save on the precious circuit area by properly designing the test fixture or the coplanar-probe construction [25], [26].…”

Section: Discussionmentioning

confidence: 99%

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A Study on Network Analyzer Self-Calibration Using an Arbitrary Device

Chen

2013

IEEE Trans. Instrum. Meas.

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This paper studies the feasibility of calibrating a vector network analyzer with an arbitrary device serving as a calibration standard. The short-open-load-reciprocal and thruattenuator-network (TAN) procedures are, respectively, extended to develop short-open-load-device and thru-attenuator-device algorithms. The developed algorithms eliminate the limitations and broaden the applicable range of the thru-open-load-reciprocal and TAN procedures by using the device under test as a transfer standard. To benchmark the developed algorithms against the thru-reflect-line algorithm, experiments are conducted with a nonreciprocal device having theoretically symmetrical reflections. Results of the experiments verify the applicability of the developed algorithms.

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Section: Discussionmentioning

confidence: 99%

“…The DUT then needs at least one high reflective port to enhance the accuracy. Accordingly, one could choose (26) In summary, the error coefficients are written in terms of X, Y, k 1 , k 2 and k 3 in (28) at the top of the next page.…”

Section: B Tad Algorithmmentioning

confidence: 99%

A Study on Network Analyzer Self-Calibration Using an Arbitrary Device

Chen

2013

IEEE Trans. Instrum. Meas.

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“…At above 100 GHz, TRL (through-reflect-line) de-embedding is commonly used [18]. In particular, multiline TRL [19] gives reasonable de-embedding results since weighted averaging over multiple lines is performed.…”

Section: De-embeddingmentioning

confidence: 99%

Tehrahertz CMOS Design for Low-Power and High-Speed Wireless Communication

Fujishima

Amakawa

Takano

et al. 2015

IEICE Trans. Electron.

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SUMMARY There have recently been more and more reports on CMOS integrated circuits operating at terahertz (≥ 0.1 THz) frequencies. However, design environments and techniques are not as well established as for RF CMOS circuits. This paper reviews recent progress made by the authors in terahertz CMOS design for low-power and high-speed wireless communication, including device characterization and modeling techniques. Low-power high-speed wireless data transfer at 11 Gb/s and 19 pJ/bit and a 7-pJ/bit ultra-low-power transceiver chipset are presented.

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“…The central values of the capacitors are taken from the model of a series discontinuity as described in § 9.5 of [12], and the inductor and resistances from [6].…”

Section: Simul Ation and Comparisonmentioning

confidence: 99%

“…It performs very well at low frequency, but being based on a lumped element circuit model, it requires the lengths of the pads and signal-to-ground interconnects to be smaller than ),, 120. For this reason, it should be used after both SOLT calibration and TRL de-embedding, resulting to a total of three de-embedding steps [6]. The Open-Thru (OT) method includes transmission line components of specified length [7].…”

Section: Introductionmentioning

confidence: 99%

Open-Thru de-embedding for graphene RF devices

Vincenzi

Deligeorgis

Coccetti

et al. 2014

2014 IEEE MTT-S International Microwave Symposium (IMS2014)

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Measuring graphene RF devices performances relies heavily on the precision of the de-embedding techniques adopted.Small line sizes increase variability issues in the RF standards and test devices, and require line width transitions. In this work, a robust and high precision de-embedding technique is adopted to the particular needs of microwave graphene devices. Two standards and only one step after SOLT calibration are used.

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Device and IC Characterization Above 100 GHz

Cited by 41 publications

References 35 publications

A Study on Network Analyzer Self-Calibration Using an Arbitrary Device

A Study on Network Analyzer Self-Calibration Using an Arbitrary Device

Tehrahertz CMOS Design for Low-Power and High-Speed Wireless Communication

Open-Thru de-embedding for graphene RF devices

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