Development of Silicon Drift Detectors and Digital Filtering Electronics for X-Ray Spectroscopy

Moguiline, E.; Gauthier, C.; Goujon, G.; Goulon, J.; Lampert, M. O.; Dressier, P.; Henck, R.

doi:10.1051/jp4/1997010

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“…Increasing the active area of the Si diodes gives morē exibility to handle the problem of complex sample environments that are frequently required in exotic XAS or XMCD experiments: very often, the detector cannot be kept very close to the sample and a large active area makes it then possible to preserve a reasonable solid angle. Count-rate consideration led us to envisage as a next step the design of multi-anode drift diodes with an active area of 2 cm 2 (Moguiline, 1996;Moguiline et al, 1997). In this detector, the collection zone was split into eight N + -implanted anodes separated by P + electrodes as shown in Fig.…”

Section: Sdd Diodes Devices Tested At the Esrfmentioning

confidence: 99%

Advanced detection systems for X-ray fluorescence excitation spectroscopy

et al. 2004

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This paper accounts for selected detector developments carried out over the past 15 years within the ESRF X-ray Absorption Spectroscopy group. This includes various types of photodiodes used as integrated current detectors. Special emphasis is put on the long-standing development of a Si drift-diode array suitable for energy-dispersive detection of X-ray fluorescence. This detector, which is now operational, was used to record high-quality XMCD/XAFS spectra on [Fe70Pt30] nanoparticles highly dispersed on a Si wafer. Using numerically deconvoluted spectra, energy resolution was decreased to 82 eV for the Si Kalphabeta line, 126 eV for the Fe Kalpha line and 176 eV for the Pt Lalpha line. A high-vacuum-compatible high-energy-resolution crystal analyzer was also installed on ID12, making it possible to record X-ray fluorescence excitation spectra in the photon-in/photon-out mode over a wide spectral range. Prospects of adapting these methods in order to investigate biological samples are briefly discussed.

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Section: Sdd Diodes Devices Tested At the Esrfmentioning

confidence: 99%