Development of Performance Characterization Methods for Optoelectronic Circuit Boards

Abstract

data of the order of 10 Gbps as a minimum to make them In this paper, we illustrate the performance evaluation economically viable. methods for optoelectronic circuit boards (OECBs). Here we However, the light coupling requirements and alignment report the details of the evaluation techniques for a tolerance become tighter as the receiver dimensions happen to bidirectional OECB developed to operate at 10 Gbps using a be smaller at such high data rates. The opto-modules are flip flip chip SMT optical transceiver. The evaluation techniques chip devices and will not be assembled using active alignment include DC and high speed optical characterization of methods. In order to achieve the desired system performance, individual component as well as at interconnect level. intermediate evaluation at each possible phase of development Performance evaluation of optical waveguide, optical DC process has to be carried out. Consequently it is necessary to characterization of VCSEL and photo diode, high speed develop systematic performance characterization techniques to optical characterization of transmitter, receiver and optical streamline the different stages of assembly process. link are described here in detail.In this paper we discuss the performance evaluation