2014
DOI: 10.1039/c4nj01319k
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Development of nanocoral-like Cd(SSe) thin films using an arrested precipitation technique and their application

Abstract: Nanocrystalline cadmium sulfoselenide thin films have been synthesized using a self-organized arrested precipitation technique with different deposition times using triethanolamine as a complexing agent. Optical, structural, morphological and photoelectrochemical solar cell properties were investigated as a function of deposition time. A UV-Vis-NIR absorption study suggested a direct allowed transition type and the band gap energy decreased from 2.01 to 1.86 eV with the increase in deposition time. X-ray diffr… Show more

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Cited by 64 publications
(53 citation statements)
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“…The linear nature of the optical absorption plot confirms the direct allowed transition and is obtained by using formula given in [9]. .…”
Section: Optical Studymentioning
confidence: 68%
See 1 more Smart Citation
“…The linear nature of the optical absorption plot confirms the direct allowed transition and is obtained by using formula given in [9]. .…”
Section: Optical Studymentioning
confidence: 68%
“…A variety of techniques presently used for the synthesis of cadmium and zinc chalcogenide semiconductor thin films [3][4][5][6][7][8]. In all these methods, APT is self organized, cost effective, suitable for large area deposition [9] and is presently usedby us to prepare CdZn(SSe) 2 thin films. In the present investigation, we propose the synthesis, growth mechanism, optostructural, morphological, compositional and photoelectrical properties of quaternary CdZn(SSe) 2 thin films by arrested precipitation technique (APT).…”
Section: Introductionmentioning
confidence: 99%
“…The crystallite size (D) for the synthesized copper selenide source material and the deposited films was calculated using Scherrer's relation D = Kk/(b cos h) [32], where K is the shape factor (0.9), h is the Bragg's angle, k (1.5406 Å ) is the wavelength of X-ray used, and b is the full width at half maximum of the respective XRD peak (in radian). The dislocation density (d) was determined using the relation d = n/D 2 [33], where n is a factor, which equals unity giving minimum dislocation density, and the microstrain (e) was evaluated from e = (b cos h)/4 [34]. The calculated crystallite size, dislocation density and microstrain results are presented in Table 1.…”
Section: Resultsmentioning
confidence: 99%
“…Such morphology is beneficial for the improvement in conversion efficiency due to large surface for effectual light absorption. [3,8,9] EDS analysis is carried out to determine actual atomic percentage of respective elements in deposited thin film. From EDS pattern, it confirms that presence of Cd, S and Se element in deposited thin film (Figure 4).…”
mentioning
confidence: 99%