Development of Mixed Pitch Grating for the Optical Addressing of Trapped Sr+ Ion with Data Analysis Techniques

Abstract

Mixed pitch gratings are developed for the optical addressing of trapped 88Sr+ ion by means of simulation and experimental-measurement approaches. Meanwhile, Python-based data analysis techniques were developed to analyze simulated and measured beam profiles. A fixed pitch grating with a pitch of 1.2 µm was used as a reference, and a mixed pitch grating with pitches of 1.1/1.2 µm of various ratios are investigated. The Python-based data analysis codes demonstrates highly-automated capability in processing both simulated and measured beam profile data to compute key parameters, including beam waist and Gaussian fitting. Mixed pitch grating delivers light beam with smaller beam waist (17.4 µm) compared to the fixed pitch grating (26.4 µm), exhibiting ~34% beam waist reduction.