2016
DOI: 10.1016/j.egypro.2016.07.050
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Development of High-efficiency Industrial p-type Multi-crystalline PERC Solar Cells with Efficiency Greater Than 21%

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Cited by 29 publications
(16 citation statements)
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“…The cell shows an efficiency ( η ) of 21.63%, an open circuit voltage ( V oc ) of 671.4 mV, a short circuit current ( I sc ) of 9.952 A (current density J sc = 40.56 mA/cm 2 ) and a fill factor (FF) of 79.44. Compared to the previous best report by Deng et al , our cell demonstrates superior efficiency, V oc and I sc . In fact, to the best of our knowledge, the cell efficiency appears to be the best reported result so far for large area (>156 mm × 156 mm), industrial grade low cost p ‐ type mc‐Si solar cells.…”
Section: Resultsmentioning
confidence: 99%
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“…The cell shows an efficiency ( η ) of 21.63%, an open circuit voltage ( V oc ) of 671.4 mV, a short circuit current ( I sc ) of 9.952 A (current density J sc = 40.56 mA/cm 2 ) and a fill factor (FF) of 79.44. Compared to the previous best report by Deng et al , our cell demonstrates superior efficiency, V oc and I sc . In fact, to the best of our knowledge, the cell efficiency appears to be the best reported result so far for large area (>156 mm × 156 mm), industrial grade low cost p ‐ type mc‐Si solar cells.…”
Section: Resultsmentioning
confidence: 99%
“…Additionally, the same front contacting pattern as the one used to fabricate conventional mc‐Si cells at JinkoSolar was used. This contacting pattern has an optical shading of ∼4%, which is larger than the one reported by Deng et al based on their photoluminescence image . As a result, this can be further optimized to increase the I sc and V oc , and thus cell efficiency.…”
Section: Resultsmentioning
confidence: 99%
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“…After spin‐coating, the thin films needed a low‐temperature (100−130 °C) bake in an ambient atmosphere. Before the PEDOT:Nafion coating process, the standard industrial processes were used for multicrystalline silicon solar cells [ 58 ] for surface texturing through metal‐catalyzed chemical etching (MCCE), [ 59 ] the p−n junction, the surface antireflection layer, the front metallization POCl 3 gas source diffusion, PECVD, and screen‐printing technologies. The wafers used met industrial specifications; they were p‐type, multicrystalline, and had a resistivity of ≈1.5 Ω·cm and thickness of 180 µm by diamond wire cutting.…”
Section: Methodsmentioning
confidence: 99%