“…Black solid lines suggest either unavailability of depth resolution data or non-applicability to the technique. Corresponding data references are as follows: conventional fluorescence and confocal microscopies (Pawley, 2006), pulsed laser microscopy (Bové et al, 2016), super-resolution light microscopies (Göttfert et al, 2013;Agarwal and Machán, 2016;Chen et al, 2019), LC-SEM (Thiberge et al, 2004), LC-TEM/STEM (de Jonge et al, 2019), cryogenic TEM (Diebolder et al, 2012;Fu et al, 2019), dynamic TEM (Lagrange et al, 2008;Egan et al, 2018), and ultrafast 4D EM (Fu et al, 2017;Zhu et al, 2020). sample under imaging is constantly replenished, damage will not be cumulative such as for a static cell.…”