2020
DOI: 10.1016/j.ultramic.2019.112887
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Development of analytical ultrafast transmission electron microscopy based on laser-driven Schottky field emission

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Cited by 43 publications
(35 citation statements)
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“…for recent reviews, see [11][12][13][14]. Similarly, the development of the electron-based ultrafast electron scattering [81][82][83][84][85][86][87][88][89][90][91][92] and microscopy [93][94][95][96][97][98][99][100][101][102][103][104][105][106][107][108] techniques is also in full swing in recent years. Upon applying the laser pulses, the excitation energy is initially stored in the photo-excited hot carriers, setting off the nonequilibrium microscopic dynamics through couplings to the lattice modes.…”
Section: Multi-messenger Ultrafast Electron Scattering and Imaging Experimentsmentioning
confidence: 99%
“…for recent reviews, see [11][12][13][14]. Similarly, the development of the electron-based ultrafast electron scattering [81][82][83][84][85][86][87][88][89][90][91][92] and microscopy [93][94][95][96][97][98][99][100][101][102][103][104][105][106][107][108] techniques is also in full swing in recent years. Upon applying the laser pulses, the excitation energy is initially stored in the photo-excited hot carriers, setting off the nonequilibrium microscopic dynamics through couplings to the lattice modes.…”
Section: Multi-messenger Ultrafast Electron Scattering and Imaging Experimentsmentioning
confidence: 99%
“…Black solid lines suggest either unavailability of depth resolution data or non-applicability to the technique. Corresponding data references are as follows: conventional fluorescence and confocal microscopies (Pawley, 2006), pulsed laser microscopy (Bové et al, 2016), super-resolution light microscopies (Göttfert et al, 2013;Agarwal and Machán, 2016;Chen et al, 2019), LC-SEM (Thiberge et al, 2004), LC-TEM/STEM (de Jonge et al, 2019), cryogenic TEM (Diebolder et al, 2012;Fu et al, 2019), dynamic TEM (Lagrange et al, 2008;Egan et al, 2018), and ultrafast 4D EM (Fu et al, 2017;Zhu et al, 2020). sample under imaging is constantly replenished, damage will not be cumulative such as for a static cell.…”
Section: Acceptable Electron Dosagementioning
confidence: 99%
“…Transmission electron microscope (TEM) temporal resolution can be extended to femtosecond (fs) timescales via incorporation of optical ports and coupling to short-pulsed lasers in an approach called ultrafast electron microscopy (UEM). [1][2][3][4][5][6] Accordingly, optical-pump/electron-probe experiments can be conducted in the manner common to other ultrafast techniques. [7][8][9] Because electrons in the probe packet experience Coulombic interactions that degrade spatiotemporal resolution, UEM experiments are often conducted in a stroboscopic manner so that the number of electrons per packet can be limited.…”
mentioning
confidence: 99%