2019
DOI: 10.1007/s41365-019-0678-z
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Development of alpha surface contamination monitor based on THGEM for contamination distribution

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Cited by 5 publications
(1 citation statement)
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“…The loss of detection efficiency is caused by the small charge signals on readout strips of this Micromegas detector that cannot exceed the threshold of VMM3. First of all, we scanned the detection efficiency with different electronics gains and high voltages of mesh to get a stable and suitable working point [12]. The efficiency is shown in figure 23.…”
Section: Beam Test At Desymentioning
confidence: 99%
“…The loss of detection efficiency is caused by the small charge signals on readout strips of this Micromegas detector that cannot exceed the threshold of VMM3. First of all, we scanned the detection efficiency with different electronics gains and high voltages of mesh to get a stable and suitable working point [12]. The efficiency is shown in figure 23.…”
Section: Beam Test At Desymentioning
confidence: 99%