Development of a Miniature Double Focusing Mass Spectrograph Using a Focal Plane Detector

Nishiguchi, Masaru; Toyoda, Michisato; Ishihara, Morio; Ohtake, M.; Sugihara, Takamitsu; Katakuse, Itsuo

doi:10.5702/massspec.54.1

Cited by 8 publications

(5 citation statements)

References 25 publications

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“…Sector-field instruments in general and MH-Mass spectrometer in particular call for high acceleration of relatively low mass ions for best performance. Accordingly, we observe a strong kinetic effect induced artifact on the IonCCD signal when coupled to a MH-Mass spectrometer: a very distinct negative peak located at the low mass side of the respective positive ion peak is observed, as reported in an earlier publication [32,34].…”

mentioning

confidence: 48%

“…This finding will certainly motivate a new design of the IonCCD allowing it to be mounted even closer to the magnet face experiencing maximum B-fields. In the thesis work of Nishiguchi [34], a different approach of artifact suppression was suggested. Instead of increasing the B', their electro-optical ion detector (EOID) was operated at B' dramatically lowered by using a magnetic shunt at the exit of the magnetic sector, preventing the secondary electrons from returning to the detector.…”

Section: Resultsmentioning

confidence: 99%

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IonCCD Detector for Miniature Sector-Field Mass Spectrometer: Investigation of Peak Shape and Detector Surface Artifacts Induced by keV Ion Detection

Hadjar

Schlathölter

Davila

et al. 2011

J. Am. Soc. Mass Spectrom.

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A recently described ion charge coupled device detector IonCCD (Sinha and Wadsworth, Rev. Sci. Instrum. 76(2), 2005; Hadjar, J. Am. Soc. Mass Spectrom. 22(4), [612][613][614][615][616][617][618][619][620][621][622][623][624] 2011) is implemented in a miniature mass spectrometer of sector-field instrument type and MattauchHerzog (MH)-geometry (Rev. Sci. Instrum. 62(11), 2618-2620, 1991; Burgoyne, Hieftje and Hites J. Am. Soc. Mass Spectrom. 8(4), 307-318, 1997; Nishiguchi, Eur. J. Mass Spectrom. 14 (1), 7-15, 2008) for simultaneous ion detection. In this article, we present first experimental evidence for the signature of energy loss the detected ion experiences in the detector material. The two energy loss processes involved at keV ion kinetic energies are electronic and nuclear stopping. Nuclear stopping is related to surface modification and thus damage of the IonCCD detector material. By application of the surface characterization techniques atomic force microscopy (AFM) and X-ray photoelectrons spectroscopy (XPS), we could show that the detector performance remains unaffected by ion impact for the parameter range observed in this study. Secondary electron emission from the (detector) surface is a feature typically related to electronic stopping. We show experimentally that the properties of the MH-mass spectrometer used in the experiments, in combination with the IonCCD, are ideally suited for observation of these stopping related secondary electrons, which manifest in reproducible artifacts in the mass spectra. The magnitude of the artifacts is found to increase linearly as a function of detected ion velocity. The experimental findings are in agreement with detailed modeling of the ion trajectories in the mass spectrometer. By comparison of experiment and simulation, we show that a detector bias retarding the ions or an increase of the B-field of the IonCCD can efficiently suppress the artifact, which is necessary for quantitative mass spectrometry.

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mentioning

confidence: 48%

Section: Resultsmentioning

confidence: 99%

IonCCD Detector for Miniature Sector-Field Mass Spectrometer: Investigation of Peak Shape and Detector Surface Artifacts Induced by keV Ion Detection

Hadjar

Schlathölter

Davila

et al. 2011

J. Am. Soc. Mass Spectrom.

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“…2 for future lunar explorations, we have been developing a mass spectrograph that employs a magnetic sector analyzer and a focal plane detector. 3,4 our aim in the explorations is quantitative analyses of lunar surface substances. Generally, a mass spectrograph using a focal plane detector will have high sensitivity and good quantitative performance.…”

Section: Journal Of Mass Spectrometrymentioning

confidence: 99%

“…Detailed descriptions of the ion optical system are presented elsewhere. 4 the design of the ion optical system was carried out with the "trIo" 16 and "trIo-DrAW" 17 computer programs, based on the transfer matrix method. [18][19][20] In this method, the geometrical trajectory of an arbitrary particle is expressed as an ion optical position vector P(x, a, y, b, g, d).…”

Section: Instrumentation Ion Opticsmentioning

confidence: 99%

Ion Optical Evaluation of a Miniature Double-Focusing Mass Spectrograph

Nishiguchi

Ishihara

Katakuse

et al. 2008

Eur J Mass Spectrom (Chichester)

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A new miniature double-focusing mass spectrograph has been designed and constructed. The ion optical system was designed based on Mattauch-Herzog geometry. The mass spectrograph employs a focal plane detector consisting of a microchannel plate, a phosphor layer, a fiber-optic plate and a charge-coupled device. For the evaluation of the ion optics of the instrument, the energy and angular focal planes were investigated both experimentally and by simulation. Double focusing was satisfactorily achieved along a straight line over a wide mass range, and the experimental and simulated results were mutually consistent. A second-order element of the transfer matrix was also measured experimentally and proved to be in good agreement with the simulated result.

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“…9 The magnetic sector mass spectrometer can simultaneously measure the signal intensities of ionic species in a given m/z range by using a focal plane detector. 10 It can also continuously measure the signal intensities of a plurality of ionic species in real time by using independent ion detectors. 11 However, that m/z range is limited.…”

Section: Introductionmentioning

confidence: 99%

Mass Analyzer Using an Alternating Electric Field with a Pause Period: Concept and Simulation

Sano¹

2020

J. Am. Soc. Mass Spectrom.

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In this mass analyzer, pulsed ions are introduced into a separation space during a pause period of the alternating electric field. Furthermore, as defined, the measured ionic species exits from the separation space during the next pause period after receiving the action of the alternating electric field for one period. At this time, the ions of the measured ionic species are energy-focused and separated from the others by the difference in displacement caused by the electric field. In the concept section, the mass analyzer and the alternating electric field were illustrated, and the conditions that the measured ionic species should satisfy were clarified. An equation giving the displacement magnitude of the measured ionic species after one period was derived, showing that the mass separation is performed based on m/z. An equation giving the mass resolution was derived from this equation. In the simulation and discussion section, the mass separation in the alternating electric field and the energy focusing of the ions of the measured ionic species were demonstrated by numerical calculations. A scanning method that changes the period of the alternating electric field was demonstrated, showing that there is no limit to the m/z range that can be analyzed. Besides, it was demonstrated that ionic species in a required m/z range can be analyzed simultaneously with the introduction of one packet of pulsed ions. It was shown that measurement operations can be repeated with no or a little wasted time. Complementarily, the direction-focusing performance of the electric sector was examined.

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Development of a Miniature Double Focusing Mass Spectrograph Using a Focal Plane Detector

Cited by 8 publications

References 25 publications

IonCCD Detector for Miniature Sector-Field Mass Spectrometer: Investigation of Peak Shape and Detector Surface Artifacts Induced by keV Ion Detection

IonCCD Detector for Miniature Sector-Field Mass Spectrometer: Investigation of Peak Shape and Detector Surface Artifacts Induced by keV Ion Detection

Ion Optical Evaluation of a Miniature Double-Focusing Mass Spectrograph

Mass Analyzer Using an Alternating Electric Field with a Pause Period: Concept and Simulation

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