1999
DOI: 10.1088/0957-0233/10/8/403
|View full text |Cite
|
Sign up to set email alerts
|

Development of a micromechanical probe-measuring instrument for surface properties characterization

Abstract: A new type of micromechanical probe-measuring instrument for the characterization of micromechanical properties and in situ surface topography has been developed. It adopts a load-adding cantilever for surface indentation and a force-sensing cantilever for profile measurement. Both the surface indentation and the profile measurement are made by using the same diamond probe. The deflected displacement of the cantilever is measured by an optical sensor. The piezo-driven precision stage with wide motion range and… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
6
0

Year Published

2003
2003
2018
2018

Publication Types

Select...
5
1
1

Relationship

0
7

Authors

Journals

citations
Cited by 8 publications
(6 citation statements)
references
References 9 publications
(9 reference statements)
0
6
0
Order By: Relevance
“…In addition, the stress concentration will be more significant. Besides, Gao 22 designed a stylus profiling instrument, where a load-adding cantilever was adopted for surface indentation and a force-sensing cantilever was adopted for profile measurement. However, the dual-cantilever structure was complex and the system suffered from a slower response.…”
Section: Development Of a Novel 3-dof Suspension Mechanism For Multi-mentioning
confidence: 99%
“…In addition, the stress concentration will be more significant. Besides, Gao 22 designed a stylus profiling instrument, where a load-adding cantilever was adopted for surface indentation and a force-sensing cantilever was adopted for profile measurement. However, the dual-cantilever structure was complex and the system suffered from a slower response.…”
Section: Development Of a Novel 3-dof Suspension Mechanism For Multi-mentioning
confidence: 99%
“…In past years micromechanical force sensors have been developed to perform characterization of micromechanical structures, such as determination of their spring characteristics and quantifying the surface roughness [4], [5], which cannot be accomplished by conventional force sensors due to their size, resolution and measurement range. Gao et al [6] used a micromechanical probe-measuring instrument to estimate the surface properties and characterize in situ surface topography. A load-adding cantilever and force-sensing cantilever were used for surface indentation and profile measurement to obtain the loaddepth plot and scanning image.…”
Section: Introductionmentioning
confidence: 99%
“…Surface measurement plays an important role in all manufacturing processes because it provides information on how well components are manufactured and subsequently how well they will perform [1]. Usually the surface measurement is confined to the measurement of surface texture or topography, which principally governs surface roughness.…”
Section: Introductionmentioning
confidence: 99%