2002
DOI: 10.1117/12.473418
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Development of a dual-probe Caliper CD-AFM for near model-independent nanometrology

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Cited by 19 publications
(17 citation statements)
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“…Mancevski等人 [59] 发展了该方法, 通过改变探针形 状使该方法可以测量多边的结构侧壁 [60,61] . 他们提出 图 7 (网络版彩图)将探针-样品之间的角度做适当倾斜的 方法测量微纳结构真实三维形貌.…”
Section: 将 该 方 法 用 于 测 量 等 离 子 刻 蚀 形 成 的 单 晶unclassified
“…Mancevski等人 [59] 发展了该方法, 通过改变探针形 状使该方法可以测量多边的结构侧壁 [60,61] . 他们提出 图 7 (网络版彩图)将探针-样品之间的角度做适当倾斜的 方法测量微纳结构真实三维形貌.…”
Section: 将 该 方 法 用 于 测 量 等 离 子 刻 蚀 形 成 的 单 晶unclassified
“…Intuitively, the use of the self-sensitive cantilever reduces the complexity of the setup since the optical sensing elements can be saved. Mancevski et al [11] proposed a caliper CD-AFM using dual atomic force microscope probes that operate together as a caliper for accessing vertical and highly reentrant sidewalls of high aspect-ratio. Tsunemi et al [12] developed a dual-probe AFM system with two cantilever probes and proposed an optics based cantilever's sensing mechanism, which gives an effective way to deal with the complexity problems occurred in a dual-probe AFM.…”
Section: Introductionmentioning
confidence: 99%
“…It demonstrates great potential to CD metrology of the sidewall structures. To measure the linewidth of high aspect-ratio features a dual probe AFM caliper was proposed [30]. However, the study presents a conceptual prototype which lacks experimental validation of the caliper's performance.…”
Section: Introductionmentioning
confidence: 99%