Development and Performance Test of Picosecond Pulse X-ray Excited Streak Camera System for Scintillator Characterization

Abstract

To observe time and wavelength-resolved scintillation events, picosecond pulse X-ray excited streak camera system is developed. The wavelength range spreads from vacuum ultraviolet (VUV) to near infrared region (110–900 nm) and the instrumental response function is around 80 ps. This work describes the principle of the newly developed instrument and the first performance test using BaF2 single crystal scintillator. Core valence luminescence of BaF2 peaking around 190 and 220 nm is clearly detected by our system, and the decay time turned out to be of 0.7 ns. These results are consistent with literature and confirm that our system properly works.

Scintillation properties of transparent Lu3Al5O12 (LuAG) ceramics doped with different concentrations of Pr3+

“…High voltage (HV) of 320 V was applied to the APD, and the shaping time was 2 μsec. Decay time profiles of the specimens were also evaluated by using our original apparatus, namely pulse X-ray equipped streak camera system [14]. The centered wavelength was set to be 315 nm and the repeated frequency of the X-ray pulse was 2 MHz.…”

Scintillation properties of composite ceramic YAG and its capability on pulse shape descrimination

“…Figure 4 represents X-ray induced decay time profiles of Ce-doped and nondoped YAG using X-ray streak camera system. 18), 19) As clearly seen, main decay times of Ce:YAG and nondoped YAG were ³100 ns and ³1¯s, respectively. Therefore pulse shape discrimination is possible in this material system because there was an enough difference in decay time.…”

“…18), 19) Monitoring wavelengths of Ce-doped and nondoped YAG pieces were 525 « 15 and 300 « 15 nm, respectively. In decay time evaluation, we used the composite sample because our system can observe wavelength resolved scintillation decay time profiles.…”

Silicate Glass-Based Nanocomposite Scintillators

“…In case of photoluminescence decays the hydrogen-filled nanosecond and microsecond pulse xenon flashlamps were used for the fast and slow decay kinetics measurements, respectively. Scintillation decay was measured using the ps X-ray pulse source excitation and streak camera detection, see the details in (Yanagida et al, 2010). SpectraSolve software package (Ames Photonics) was used to apply deconvolution procedures to extract true decay times.…”

“…I n a d d i t i o n , t h e r e i s s l o w e r d e c a y p r o c e s s w h i c h overestimates the fit above 60-70 ns and must be due to the delayed recombination process arising in the transport stage of scintillator mechanism. Excitation by picosecond X-ray pulse, for technical details see (Yanagida et al, 2010).…”