2018
DOI: 10.1134/s1061830918080041
|View full text |Cite
|
Sign up to set email alerts
|

Determining the Depth of Occurrence of Defects in Multilayer PCM Structures by Acoustic Methods Based on the Mechanical Impedance Value

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2020
2020
2023
2023

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 1 publication
0
1
0
Order By: Relevance
“…Na [ 23 ] used EMI technology to permanently connect the PZT transducer to the host structure for monitoring, and used EMI technology to create a field no-reference NDT method for detecting composite structure debonding. Chertishchev [ 24 ] demonstrated that the depth of defects in honeycomb structure can be effectively distinguished by the magnitude of mechanical impedance and the characteristic indication of cell walls on the C-scan of the entire object surface. However, the sensitivity of the impedance method decreases sharply with increasing skin stiffness or peel size.…”
Section: Introductionmentioning
confidence: 99%
“…Na [ 23 ] used EMI technology to permanently connect the PZT transducer to the host structure for monitoring, and used EMI technology to create a field no-reference NDT method for detecting composite structure debonding. Chertishchev [ 24 ] demonstrated that the depth of defects in honeycomb structure can be effectively distinguished by the magnitude of mechanical impedance and the characteristic indication of cell walls on the C-scan of the entire object surface. However, the sensitivity of the impedance method decreases sharply with increasing skin stiffness or peel size.…”
Section: Introductionmentioning
confidence: 99%