2003
DOI: 10.1539/joh.45.94
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Determining of Crystalline Silica in Respirable Dust Samples by Infrared Spectrophotometry in the Presence of Interferences

Abstract: Determining of Crystalline Silica in Respirable Dust Samples by Infrared Spectrophotometry in the Presence of Interferences: Jun Ojima. National Institute of Industrial Health—Infrared Spectrophotometry (IR) is now widely used to determine crystalline silica in industrial dust samples. Though the IR method has many advantages when dealing with respirable dust samples, some serious analytical errors are often caused by interference minerals contamination. These minerals have a characteristic absorption band cor… Show more

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Cited by 95 publications
(75 citation statements)
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References 19 publications
(33 reference statements)
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“…In IR spectrophotometry, the interference is limited by computerized development of the curves correcting their infl uence, e.g. by scaled subtraction of interferent spectra and forming higher-order derivative spectra [93,96,99,100,102,106,107]. Irrespective of the method used, it is possible to carry out a procedure of removing some sample components by ashing or chemically dissolving them, prior to the analytical measurements [96,99,102].…”
Section: Methods For Determination Of Crystalline Silicamentioning
confidence: 99%
“…In IR spectrophotometry, the interference is limited by computerized development of the curves correcting their infl uence, e.g. by scaled subtraction of interferent spectra and forming higher-order derivative spectra [93,96,99,100,102,106,107]. Irrespective of the method used, it is possible to carry out a procedure of removing some sample components by ashing or chemically dissolving them, prior to the analytical measurements [96,99,102].…”
Section: Methods For Determination Of Crystalline Silicamentioning
confidence: 99%
“…DBB CN 01 showed an additional doublet at 1412 and 1467 cm −1 . This doublet can be attributed to the interference of smectite [31].…”
Section: Resultsmentioning
confidence: 93%
“…Quartz and feldspar are often present in pottery clays either because they are present already in the raw clay, or because they are added as temper. The bands occurring at 462 and 514 cm −1 are assigned to mixed Si-O-Si and O-Si-O bending mode [17]. The band at 470 cm −1 due to Si-O band is free from any temperature effects.…”
Section: Ftir Studiesmentioning
confidence: 95%