Determination of trace metals in river water and suspended solids by TXRF spectrometry

Reus, U.; Markert, Bernd; Hoffmeister, C.; Spott, D.; Guhr, H.

doi:10.1007/bf00635470

Cited by 17 publications

(1 citation statement)

References 3 publications

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“…Consequently, the TXRF analysis has been mainly utilized in the area of semiconductor materials and recently in the studies of environmental water, biological materials and geological minerals. [1][2][3][4] When the sample to be analyzed is a solution, it is changed to the solid film on a sample-carrier by the micro-drop method. 5,6) Hence, the preparation of analytical samples and the calibration of observed data are very important in the TXRF analysis of solution samples.…”

Section: Introductionmentioning

confidence: 99%

Determination of Trace Impurities in Graphite and Silicon Carbide by Total Reflection X-ray Fluorescence Spectrometry after Homogeneous Liquid-Liquid Extraction.

et al. 2000

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Using homogeneous liquid-liquid extraction as a pre-concentration method, a determination procedure of trace impurities (Fe, Ni and Cu) by total reflection X-ray fluorescence (TXRF) analysis was developed and optimized for graphite and silicon carbide samples. The samples were decomposed by alkali fusion. The residue was dissolved in a mixture of pentadeca-fluorooctanoic acid (PFOA), acetone and water, and the analytes were homogeneously dispersed by the aid of phenanthroline (phen). After phase separation with pHadjustment, a portion of the sedimented water-immiscible liquid was pipetted on the polyester film that covered a silicon wafer sample-carrier. Then, the droplet was dried in a vacuum and analyzed by TXRF. Analytical values in the sub-ppm or ppm level were well agreed with the certified values of the standard samples or the values observed by ICP-OES for a few samples.

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