2017
DOI: 10.1007/s00339-017-1437-9
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Determination of the electronic properties of Cu2ZnSnSe4-based solar cells by impedance spectroscopy and current–voltage characteristics analysis

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Cited by 13 publications
(13 citation statements)
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“…It can be found that all the electrical parameters of the solar cells deposited on FTO are lower than the ones deposited on Mo. For CZTSe absorbers deposited on Mo, the best solar cells have led to efficiencies up to 8.0 % [21,22]. The best efficiency of solar cells on FTO back contact is about 2.3%.…”
Section: IIImentioning
confidence: 94%
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“…It can be found that all the electrical parameters of the solar cells deposited on FTO are lower than the ones deposited on Mo. For CZTSe absorbers deposited on Mo, the best solar cells have led to efficiencies up to 8.0 % [21,22]. The best efficiency of solar cells on FTO back contact is about 2.3%.…”
Section: IIImentioning
confidence: 94%
“…In this work, we compared the growth of Cu 2 ZnSnSe 4 (CZTSe) deposited on two different glass coated TCOs : AZO (ZnO:Al) and FTO. The results are compared to cells with classical Mo back contact [21,22]. The effect of substrate combined with the deposition temperature of the absorber on morphology, composition, crystallinity of CZTSe and the optoelectronic properties of the solar cells will be discussed.…”
Section: Introductionmentioning
confidence: 99%
“…This has been explained with a large series resistance in kesterites at low temperatures arising from either too deep acceptors [53] or a barrier at the back contact [54]. A high series resistance alone, even if temperature independent, could lead to a capacitance step due to circuit response if an inadequate equivalent circuit model is used [55], emphasizing the need to use appropriate models to analyze admittance measurements [5,56,57]. In the literature no complete agreement on this phenomenon is found, e.g.…”
Section: Intrinsic Defects In Kesteritesmentioning
confidence: 99%
“…The MoSe 2 interfacial layers with the thicknesses similar to ours and thicker than ours were previously reported by some researchers for the CZTSe based films grown by sputtering method in the literature. In these studies, the thicknesses of the MoSe 2 interfacial layers changed in the range of 200 to 1800 nm at different selenization temperatures 60‐62 . Further investigations are needed to clarify the effects of selenization parameters such as Se quantity, selenization temperature, pressure, and time on the formation of MoSe 2 interfacial layers, 63 but we did not make these investigations in this work.…”
Section: Resultsmentioning
confidence: 93%
“…In these studies, the thicknesses of the MoSe 2 interfacial layers changed in the range of 200 to 1800 nm at different selenization temperatures. [60][61][62] Further investigations are needed to clarify the effects of selenization parameters such as Se quantity, selenization temperature, pressure, and time on the formation of MoSe 2 interfacial layers, 63 but we did not make these investigations in this work. Here, in the case of sample A2, we believe that the ZnS layer over the Mo film which has a high melting point acts as a barrier layer for the diffusion of Se through the absorber layer into the Mo film and the formation rate of MoSe 2 interfacial layer might be suppressed thanks to the ZnS layer.…”
Section: Resultsmentioning
confidence: 97%