IAS '95. Conference Record of the 1995 IEEE Industry Applications Conference Thirtieth IAS Annual Meeting
DOI: 10.1109/ias.1995.530420
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Determination of switching losses in IGBTs by loss-summation-method

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Cited by 9 publications
(2 citation statements)
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“…[10] focuses on design considerations rather than techniques for estimating losses. A loss summation method is presented in [11], which first determines values of parasitic elements in the model then the switching energy curves. Even though the method compares well to actual measurements, the simulations are computationally intense and involve detailed knowledge of the physical structure.…”
Section: Literature Reviewmentioning
confidence: 99%
“…[10] focuses on design considerations rather than techniques for estimating losses. A loss summation method is presented in [11], which first determines values of parasitic elements in the model then the switching energy curves. Even though the method compares well to actual measurements, the simulations are computationally intense and involve detailed knowledge of the physical structure.…”
Section: Literature Reviewmentioning
confidence: 99%
“…Loss estimation methods based on thermal measurements, although applicable regardless of the switching scheme, require knowledge of thermal resistances and installation of thermocouples, which is usually expensive and inconvenient [15][16][17][18]. Model-based method presented in [19] requires detailed knowledge of the IGBT and diode physical structure and involves extensive simulations, while methods presented in [20,21] are device-specific and require applying a similar procedure to an IGBT-diode pair when different gate-drive circuits, dc-link voltage and junction temperatures are of interest. The methods presented in [22][23][24][25][26] have the potential for extension to aperiodic switching, but have only been tested for periodic switching.…”
Section: Introductionmentioning
confidence: 99%