1999
DOI: 10.1063/1.125066
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Determination of single-pass optical gain and internal loss using a multisection device

Abstract: We describe a technique for the measurement of optical gain and loss in semiconductor lasers using a single, multisection device. The method provides a complete description of the gain spectrum in absolute units and over a wide current range. Comparison of the transverse electric and transverse magnetic polarized spectra also provides the quasi-Fermi-level energy separation. Measurements on AlGaInP quantum well laser structures with emission wavelengths close to 670 nm show an internal loss of 10 cm Ϫ1 and pea… Show more

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Cited by 110 publications
(57 citation statements)
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“…The spectral gain measurements in our experiment were carried out using a multi-section device technique mentioned in [11]. The gain measurements were carried out under pulsed current injection with the devices being temperature controlled and all the data taken at room temperature.…”
Section: Spectral Gain Measurements and Discussionmentioning
confidence: 99%
“…The spectral gain measurements in our experiment were carried out using a multi-section device technique mentioned in [11]. The gain measurements were carried out under pulsed current injection with the devices being temperature controlled and all the data taken at room temperature.…”
Section: Spectral Gain Measurements and Discussionmentioning
confidence: 99%
“…1. At zero net modal gain, confined material gain is equal to the internal optical losses [5]. From Fig.…”
Section: Spectral Gain Measurementsmentioning
confidence: 99%
“…The experimental method used to carry out spectral gain measurement is described elsewhere [5]. The gain measurements were carried out under pulsed current injection with the devices being temperature controlled and all the data taken at room temperature.…”
Section: Spectral Gain Measurementsmentioning
confidence: 99%
“…The spectral measurements therefore have to be done using a high resolution spectrometer in order to resolve the spectral modes and not to distort the observed contrast ratio and/or line width of the modes. Since such a high resolution spectrometer in the 1.60-1.80 µm wavelength region is not available to us we have used a measurement technique based on the analysis of ASE spectra from different lengths of amplifiers as described by (Oster et al 1997;Thomson et al 1999). By this method the gain can be calculated from the ASE spectra over a wide range of injection current densities.…”
Section: Gain Measurement Method Device Design and Fabricationmentioning
confidence: 99%
“…Under the condition that there is no optical feedback and there is no gain saturation in the amplifier, the net modal gain G of a semiconductor optical amplifier (SOA) of length L is related to its ASE output power P according to (Thomson et al 1999):…”
Section: Gain Measurement Method Device Design and Fabricationmentioning
confidence: 99%