2004
DOI: 10.1021/ja047311k
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Determination of Rate Constants for Charge Transfer and the Distribution of Semiconductor and Electrolyte Electronic Energy Levels in Dye-Sensitized Solar Cells by Open-Circuit Photovoltage Decay Method

Abstract: A combination of electron lifetime measurement in nanoparticles as a function of the Fermi level position at high resolution in the potential scale with a new model to describe this dependence provides a powerful tool to study the microscopic processes and parameters governing recombination in dye-sensitized solar cells. This model predicts a behavior divided in three domains for the electron lifetime dependence on open-circuit voltage that is in excellent agreement with the experimental results: a constant li… Show more

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Cited by 888 publications
(907 citation statements)
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“…3b). In such a dye-sensitized TiO 2 solar cell, the dye regeneration reaction, which eventually yields I 3 À from I À , is an 'in situ' process with the time constant on micron-second scale 24,29 . Meanwhile, the robustness of the I 3 À in oxidizing Li 2 O 2 has also been demonstrated in the battery tests.…”
Section: Resultsmentioning
confidence: 99%
“…3b). In such a dye-sensitized TiO 2 solar cell, the dye regeneration reaction, which eventually yields I 3 À from I À , is an 'in situ' process with the time constant on micron-second scale 24,29 . Meanwhile, the robustness of the I 3 À in oxidizing Li 2 O 2 has also been demonstrated in the battery tests.…”
Section: Resultsmentioning
confidence: 99%
“…68,72,[125][126][127] It was found that both the effective electron diffusion coefficient, D n , and the effective electron lifetime, t n , 128,129 that are measured become a function of the steady state. 13,68,72,[129][130][131][132][133][134][135] Using quasi-equilibrium arguments, the variations of both diffusion coefficient and lifetime were attributed to the statistics of electrons in the material, which deviates from dilution, as described by thermodynamic factors. 136 The varying D n was recognized as a chemical diffusion coefficient, 55,127 and the correlation between variations of D n and t n , 135 was explained by a common origin of their variations in an exponential distribution in the bandgap.…”
Section: Transport Propertiesmentioning
confidence: 99%
“…Recientemente, Bisquert et al han desarrollado un método para obtener información acerca del tiempo de vida de los electrones en las películas de TiO 2 , de las curvas de decaimiento del potencial de circuito abierto (OCVD, por sus siglas en inglés). 40 Los diferentes pasos involucrados en este proceso pueden ser identificados, transformando las curvas de OCVD, en gráficas de tiempo de vida media de los electrones, τ n , versus el potencial de circuito abierto en la oscuridad, E OCP (t). El τ n de los electrones en el TiO 2 está determinado por el recíproco de la derivada de la curva de decaimiento, normalizado con el voltaje térmico, como se muestra en la Ecuación 5:…”
Section: Potencial De Circuito Abiertounclassified
“…Para la película obtenida por Dr. Blade, no se presenta, o es muy pequeña, la zona donde τ n es constante, zona que se atribuye a los electrones libres en la banda de conducción del semiconductor. 40,41 La curva muestra que desde las primeras etapas, τ n , está controlado por la liberación de los electrones que se encuentran en los estados superficiales, llevando a un incremento paulatino del τ n . Finalmente, se llega a la etapa donde el τ n se incrementa pronunciadamente, debido a la liberación de los e -atrapados en los estados superficiales profundos.…”
Section: Potencial De Circuito Abiertounclassified
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