2008
DOI: 10.1088/1742-6596/100/8/082033
|View full text |Cite
|
Sign up to set email alerts
|

Determination of optical properties of a-SiOxNy thin films by ellipsometric and UV-visible spectroscopies

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
10
0

Year Published

2012
2012
2021
2021

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 14 publications
(10 citation statements)
references
References 11 publications
0
10
0
Order By: Relevance
“…BME Frontiers [34,35], while the thermal-optic coefficients are largely independent of stoichiometry [26]. The measured elemental ratios for SiO x and SiN y used in this work are Si 37% and O 63% and Si 53.8%, N 43.8%, and O 2.4%, respectively.…”
mentioning
confidence: 87%
“…BME Frontiers [34,35], while the thermal-optic coefficients are largely independent of stoichiometry [26]. The measured elemental ratios for SiO x and SiN y used in this work are Si 37% and O 63% and Si 53.8%, N 43.8%, and O 2.4%, respectively.…”
mentioning
confidence: 87%
“…SiO x N y thin films of varying oxygen and nitrogen ratios can be grown by using, e.g. chemical vapor deposition (CVD) [33,34], laser ablation [35], plasma nitridation [36,37], ion-assisted deposition [38] and sputtering [27,[39][40][41][42][43][44].…”
Section: Introductionmentioning
confidence: 99%
“…In the magnetron sputtering process, silicon oxynitride thin films are usually deposited using a mixture of argon, nitrogen and oxygen [39,41,42,44]. Recently, Hänninen et al [24] reported the preparation of SiO x N y thin films by magnetron sputtering using nitrous oxide as a single-source precursor.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, the method makes it possible to determine the parameters for which a model describing the reflectance spectra of the film system must be built in order to theoretically obtain the values of ψ and ∆. Then, the optical parameters of the individual layers are deduced from fitting the experimental and modelled data [28]. The spectra of ψ and ∆ were measured using variable angle spectroscopic ellipsometry (VASE; J.A.…”
Section: Methodsmentioning
confidence: 99%