Determination of grain shape of laser-irradiated FePdCu thin alloy films

Abstract

The irradiation with the 10 ns pulsed infrared Nd:YAG laser was applied to transform FePdCu multilayers into chemically ordered L1 0 phase. The X-ray diffraction methods (Θ/2Θ scan, ψ-scan, ω-scan) were used to trace the presence of L1 0 phase after laser annealing with different number of pulses. The size and shape of crystallites was determined depending on their orientation with respect to film plane. The (111) oriented crystallites of constituent metals were built as coherent domains spreading through multilayers during deposition of films. Laser annealing induced the transformation of multilayers to alloy, and the ordering of (111) oriented crystallites. Simultaneously, the (002) oriented crystallites appeared confirming the transformation to L1 0 alloy.

Microstructure Characterization of Multilayer Thin Coatings ZrN/Si3N4 by X‐Ray Diffraction Using Noncoplanar Measurement Geometry

“…The experimental points are estimated from the same expression (7), however, in this case the parameters m and e are obtained by fitting single profiles for each reflection on the basis of the used theoretical model, and the direction corresponds to the values from Table . Evidently, the diffraction profile broadening due to the grains size depends on , which confirms the validity of used grain shape model implying the anisotropy effect . The microstructural parameters obtained from the fitting of the whole scan and those obtained solely for 020 reflection () are in a very good agreement, which confirms the correctness of the size estimation in the direction parallel to the sample surface.…”

“…The fitting with the ellipsoidal grains showed better results than that with the parallelepiped and ideally spherical ones. When applying an ellipsoidal grain shape model, the size distribution function becomes anisotropic, with the appearing dependence of the reflection intensity on the . The quantity is related to the angle , the parameter of the Gauss distribution function and the sizes of an ellipsoid (grain shape) by the following expressions: where and are the smaller and larger axes of an ellipsoid, respectively.…”

Electrical Transport and Magnetic Properties of Metal/Metal Oxide/Metal Junctions Based on Anodized Metal Oxides

“…The Bragg-Brentano geometry was adopted and each sample was measured in 2θ range of 20 − 90 degrees. Details about the measurement protocol and equipment setup used in our laboratory can be found in [41]. Morphology studies were performed with a scanning electron microscope (SEM, Tescan Vega 3, Fuveau, France) with a secondary electron detector.…”

CuO-Ga2O3 Thin Films as a Gas-Sensitive Material for Acetone Detection

“…Additionally, in order to reduce signal from the Si wafer, a scattering vector was tilted by an angle of 3 degrees with respect to the diffraction plane. Details about measurement conditions have been described by the authors of [102,103]. The analysis of the obtained diffraction patterns was performed with FullProf software [104].…”