Determination of crystal orientation by an area-detector image for surface X-ray diffraction

Abstract

A new method of calculating the crystal orientation matrix (U matrix) of a specified sample using two‐dimensional X‐ray diffraction spots that are recorded on an area detector is presented. In this way, the U matrix is calculated using at least three two‐dimensional diffraction spots of known two‐dimensional indices, which provide the projection of the crystal truncation rod onto the detector. The method, in the case of surface X‐ray diffraction measurements with an area detector, enables easier and faster sample alignment than the conventional method to determine the U matrix.

X-ray Reciprocal-Lattice Space Imaging Method for Quick analysis of Buried Crystalline Nanostructure - a Diffraction Method Fixed at an Angular Position

“…This can be achieved by examination of the overall diffraction pattern that is obtained with a single exposure to x rays with the sample and detector fixed in angle and position. [7], [8] 2.3 Instrumentation In X-ReSI, there is no need for complicated equipment or mechanisms, unlike in conventional diffractometers. For rapid x -ray structural analysis of ultra-fine structures, the angular precision of the rotating mechanism that controls the angle between the sample surface and the incident x rays is 0.0004 ° /pulse with a range of ± 5 °.…”