2010
DOI: 10.1080/00032711003653882
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Determination of Chemical Homogeneity of Fire Retardant Polymeric Nanocomposite Materials by Near-Infrared Multispectral Imaging Microscopy

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Cited by 8 publications
(14 citation statements)
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References 27 publications
(41 reference statements)
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“…Data processing procedures were performed with the Jade 8 program package. 24 The surface and cross-sectional morphologies of the composite films were examined under vacuum with a JEOL JSM-6510LV/LGS Scanning Electron Microscope with standard secondary electron (SEI) and backscatter electron (BEI) detectors. Prior to SEM examination, the film specimens were made conductive by applying a 20 nm gold–palladium-coating onto their surfaces using an Emitech K575x Peltier Cooled Sputter Coater (Emitech Products, TX).…”
Section: Methodsmentioning
confidence: 99%
“…Data processing procedures were performed with the Jade 8 program package. 24 The surface and cross-sectional morphologies of the composite films were examined under vacuum with a JEOL JSM-6510LV/LGS Scanning Electron Microscope with standard secondary electron (SEI) and backscatter electron (BEI) detectors. Prior to SEM examination, the film specimens were made conductive by applying a 20 nm gold–palladium-coating onto their surfaces using an Emitech K575x Peltier Cooled Sputter Coater (Emitech Products, TX).…”
Section: Methodsmentioning
confidence: 99%
“…The scan rate was 50 per minute. Data processing procedures were performed with the Jade 8 program package (Duri et al, 2010). The surface and cross-sectional morphologies of the composite films were examined under vacuum with a JEOL JSM-6510LV/LGS Scanning Electron Microscope with standard secondary electron (SEI) and backscatter electron (BEI) detectors.…”
Section: Methodsmentioning
confidence: 99%
“…The scan rate was 5° per minute. Data processing procedures were performed with the Jade 8 program package [47]. Scanning electron microscopic images of surface and cross section of the polysaccharide composite materials were taken under vacuum with an accelerated voltage of 3 kV using Hitachi S4800 scanning electron microscope (SEM).…”
Section: Methodsmentioning
confidence: 99%