2018
DOI: 10.1039/c8ay00344k
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Determination of chemical composition in multilayer polymer film using ToF-SIMS

Abstract: Time-of-flight secondary ion mass spectrometry is a widely used surface analytical technique, which can provide chemical information from both the uppermost surface and underneath the surface for various materials.

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Cited by 6 publications
(8 citation statements)
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“…103 Note that depth profiling with ToF-SIMS can be extended beyond binary systems. 103,105 Ren et al showed that spin-coated films of poly(bisphenol A decane ether) (BA-C10) exhibit a complex topography in optical microscopy, including droplets and striations, that depends on the type of solvent used for casting. 104 The authors examined the structure of these topographic features using a combination of depth F I G U R E 7 Depth profiling of sodium triflate in poly(hydroxystyrene-co-acrylic acid-co-styrene).…”
Section: Depth Profilingmentioning
confidence: 99%
See 1 more Smart Citation
“…103 Note that depth profiling with ToF-SIMS can be extended beyond binary systems. 103,105 Ren et al showed that spin-coated films of poly(bisphenol A decane ether) (BA-C10) exhibit a complex topography in optical microscopy, including droplets and striations, that depends on the type of solvent used for casting. 104 The authors examined the structure of these topographic features using a combination of depth F I G U R E 7 Depth profiling of sodium triflate in poly(hydroxystyrene-co-acrylic acid-co-styrene).…”
Section: Depth Profilingmentioning
confidence: 99%
“…An example of a multilayer film is shown in Figure 8A, where depth profiling in conjunction with imaging confirms the formation of distinct alternating layers of PS and PMMA 103 . Note that depth profiling with ToF‐SIMS can be extended beyond binary systems 103,105 . Ren et al showed that spin‐coated films of poly(bisphenol A decane ether) (BA‐C10) exhibit a complex topography in optical microscopy, including droplets and striations, that depends on the type of solvent used for casting 104 .…”
Section: Analysis Of Polymer Films and Coatingsmentioning
confidence: 99%
“…Within this context, time-of-flight secondary ion mass spectrometry (ToF-SIMS) characterization technique emerged as a powerful tool to investigate the near-surface structures 1 and chemical composition 2 of polymers. One of the limits of polymer chemical depth profiling using ToF-SIMS arises from the chemical damage induced by the formation of free radicals leading to chain scissions and crosslinking.…”
Section: Introductionmentioning
confidence: 99%
“…In the food packaging field, there is usually no single material that has all the requirements for the conservation of a specific product and so the combination of different materials is often used to optimize the packaging. Multilayer films have thus gained attention due to these providing certain mechanical, barrier or heat-sealing properties that monolayer films cannot offer [2,3]. Multilayer films have been used for creating AO or antimicrobial (AM) packaging using polymers alone or in combination with other materials such as paper or fibers [4][5][6][7].…”
Section: Introductionmentioning
confidence: 99%