Determination of a small vertical electron beam profile and emittance at the Swiss Light Source

Andersson, Åke; Böge, M.; Lüdeke, Andreas; Schlott, V.; Streun, A.

doi:10.1016/j.nima.2008.02.095

Cited by 42 publications

(33 citation statements)

References 13 publications

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“…We note that the PSF of the camera can be decomposed further as the x-ray camera has an x-ray screen, a lens, and a CCD chip; however, we consider this system as a whole with its own PSF. Equating S to zero in expression (1) gives the point spread function width of the system, AE 0 . Let us focus on the PSF width of the diffraction through the pinhole.…”

Section: Point Spread Function Of the X-ray Pinhole Camera: Analymentioning

confidence: 99%

“…Third generation synchrotron light sources are characterized by low emittance, and with the top-up operation becoming routine, they can afford (in terms of reduced lifetime) to operate at extremely low emittance coupling [1]. The measurement of the emittance can be done indirectly by measuring the transverse beam size using the synchrotron radiation produced by it.…”

Section: Introductionmentioning

confidence: 99%

“…However, due to the natural opening angle of the synchrotron radiation [5,6], the maximum distance between the two slits is limited. In the visible range and for medium energy machines, i.e., for maximum opening angle between the slits of the order of 5 mrad, this leads to a minimum measurable vertical beam size in the range of 20 m. Another method for measuring the beam size consists of measuring the profile of the vertical polarization of the bending magnet radiation [1]. This method has recently shown the capability to accurately measure vertical beam sizes as small as 6 m. However, this method requires significant experimental effort as well as extensive computations to establish routine operation.…”

Section: Introductionmentioning

confidence: 99%

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X-ray pinhole camera resolution and emittance measurement

Thomas

Rehm

Martin

et al. 2010

Phys. Rev. ST Accel. Beams

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Third generation synchrotron light sources are characterized by a low emittance and a low emittance coupling. Some light sources are already operating with extremely low coupling close to 0.1%. Measurement of the transverse beam size is generally used to measure the emittance and the coupling. To this end, several systems are currently used and an x-ray pinhole camera is one of them. In this paper we derive the point spread function of the x-ray pinhole camera both analytically and numerically using the Fresnel diffraction integral and taking into account the broadband spectrum of the bending magnet source, and we show that an optimized design allows the measurement of extremely small vertical beam sizes below 5 m. The point spread function of several scintillator screens is also measured, and it shows that the contribution of the diffraction and the screen point spread functions have to be taken into account for an accurate measurement of a low coupling. Finally, we show measurements of the vertical beam sizes as small as 6 m for our nonoptimized setup.

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Section: Point Spread Function Of the X-ray Pinhole Camera: Analymentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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X-ray pinhole camera resolution and emittance measurement

Thomas

Rehm

Martin

et al. 2010

Phys. Rev. ST Accel. Beams

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“…Each ring in the MAX IV project will be equipped with two diagnostic beamlines based on imaging of the electron beam using visible to ultraviolet synchrotron radiation. The design will be similar to that given by Andersson et al (2008) and Saá Herná ndez et al…”

Section: Rf Systemmentioning

confidence: 99%

The MAX IV storage ring project

et al. 2014

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The MAX IV facility, currently under construction in Lund, Sweden, features two electron storage rings operated at 3 GeV and 1.5 GeV and optimized for the hard X-ray and soft X-ray/VUV spectral ranges, respectively. A 3 GeV linear accelerator serves as a full-energy injector into both rings as well as a driver for a short-pulse facility, in which undulators produce X-ray pulses as short as 100 fs. The 3 GeV ring employs a multibend achromat (MBA) lattice to achieve, in a relatively short circumference of 528 m, a bare lattice emittance of 0.33 nm rad, which reduces to 0.2 nm rad as insertion devices are added. The engineering implementation of the MBA lattice raises several technological problems. The large number of strong magnets per achromat calls for a compact design featuring small-gap combined-function magnets grouped into cells and sharing a common iron yoke. The small apertures lead to a low-conductance vacuum chamber design that relies on the chamber itself as a distributed copper absorber for the heat deposited by synchrotron radiation, while non-evaporable getter (NEG) coating provides for reduced photodesorption yields and distributed pumping. Finally, a low main frequency (100 MHz) is chosen for the RF system yielding long bunches, which are further elongated by passively operated thirdharmonic Landau cavities, thus alleviating collective effects, both coherent (e.g. resistive wall instabilities) and incoherent (intrabeam scattering). In this paper, we focus on the MAX IV 3 GeV ring and present the lattice design as well as the engineering solutions to the challenges inherent to such a design. As the first realisation of a light source based on the MBA concept, the MAX IV 3 GeV ring offers an opportunity for validation of concepts that are likely to be essential ingredients of future diffraction-limited light sources.

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“…This has been demonstrated by a first monitor built in 2008 at SLS for the determination of the vertical beam emittance [1]. The monitor uses the so-called π-polarization method to determine the vertical beam size from vertically polarized (π-polarized) vis-UV SR imaged onto a CCD camera.…”

Section: Introductionmentioning

confidence: 99%