Methods for measuring sub-pmrad vertical emittance at the Swiss Light Source

Breunlin, Jonas; Andersson, Åke; Milas, Natalia; Hernández, Ángela Saá; Schlott, V.

doi:10.1016/j.nima.2015.09.032

Cited by 6 publications

(8 citation statements)

References 10 publications

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“…The method expects to have advantages over the traditional double-slit interferometry because of the higher acceptance angle and higher flux on the detector. The smallest electron beam size measured by the obstacle diffractometer was reported to be 3 μm with less than 10% rms error [34].…”

Section: π Polarization With Diffraction Obstaclementioning

confidence: 96%

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Source size measurement options for low-emittance light sources

Samadi

Shi

Dallin

et al. 2020

Phys. Rev. Accel. Beams

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Radiation-based techniques for measuring electron source sizes are widely used as emittance diagnostics at existing synchrotron sources. Three of these techniques, namely, pinhole imaging, double-slit interferometry, and a K-edge filter-based beam position and size monitor system (ps-BPM), are evaluated for measuring source sizes at low-emittance storage rings. Each technique is reviewed with a detailed system description, design optimization, and practical considerations targeted for small source sizes. Pinhole imaging has the simplest setup and gives the beam profile in both transverse dimensions but with limited resolution. Double-slit interferometry has the highest resolution but with a limited detectable size range. The ps-BPM system shows reasonable resolution for monitoring small source sizes and divergence and can give real-time information of the source position and angle. New facilities may consider an integrated system that combines some or all of these techniques.

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Section: π Polarization With Diffraction Obstaclementioning

confidence: 96%

“…To improve the resolution of the π-polarization method, diffraction obstacles with different sizes can be introduced to block the central part of the photon beam [32,33]. This so-called "obstacle diffractometer" is a variation of the double-slit interferometer.…”

Section: π Polarization With Diffraction Obstaclementioning

confidence: 99%

Source size measurement options for low-emittance light sources

Samadi

Shi

Dallin

et al. 2020

Phys. Rev. Accel. Beams

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“…These elements are  a standard double-slit target,  a polarizer,  two achromatic focusing lenses,  optical bandpass filter,  an image-detection system (see the next subsection). The use of an optical table outside the radiation tunnel will also allow for a comparison of direct spot imaging, double-slit interferometry [10][11][12][13][14][15] and the X-ray baffle method with pi-polarized light [6,13,16] for vertical beam-size measurements. Currently it seems, however, that double-slit interferometry is the most flexible method covering beam sizes between 11 and 160 m.…”

Section: Transition From Bessy II To Bessy-vsrmentioning

confidence: 99%

“…The transfer-optical elements enable selection of polarization, wavelength, bandwidth, and include periscope optics for an exchange of the transversal light-beam axes on the optical table. Measurements with a fast streak-camera (FSC) and also geometrical beam imaging of larger profiles as well as interferometry of the vertical beam size by using the X-ray baffle method with pi-polarized light [6,16] are possible. During the write-up of this paper, this beamline has been optimized (new toroidal mirror M2, additional collimation systems, new RF dividers, further motorization, etc.)…”

Section: Bunch Length: High Time Resolution and 2d Streak-camera Modesmentioning

confidence: 99%

Bunch-resolved diagnostics for a future electron-storage ring

Schiwietz

Hwang

Jankowiak

et al. 2021

Nuclear Instruments and Methods in Physics Research Section A:

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“…Beside these, focus-free imaging with X-ray pinhole cameras is used in many accelerator laboratories [327,328]. Furthermore, the wave optics features of the emitted radiation can be exploited [329,330]. In addition, coded-aperture imaging is sometimes applied [331,332] which is a technique well-developed among X-ray astronomers.…”

Section: Beam Position Monitoringmentioning

confidence: 99%

Beam Diagnostic Requirements: an Overview

Kube

2020

Preprint

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Beam diagnostics and instrumentation are an essential part of any kind of accelerator. There is a large variety of parameters to be measured for observation of particle beams with the precision required to tune, operate, and improve the machine. In the first part, the basic mechanisms of information transfer from the beam particles to the detector are described in order to derive suitable performance characteristics for the beam properties. However, depending on the type of accelerator, for the same parameter, the working principle of a monitor may strongly differ, and related to it also the requirements for accuracy. Therefore, in the second part, selected types of accelerators are described in order to illustrate specific diagnostics needs which must be taken into account before designing a related instrument.

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Methods for measuring sub-pmrad vertical emittance at the Swiss Light Source

Cited by 6 publications

References 10 publications

Source size measurement options for low-emittance light sources

Source size measurement options for low-emittance light sources

Bunch-resolved diagnostics for a future electron-storage ring

Beam Diagnostic Requirements: an Overview

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