Detection of Strain in Evaporated Films by Wavefront Reconstruction

Magill, P. J.; Young, Tony T.

doi:10.1116/1.1492520

Cited by 12 publications

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“…to 40sec. and holograms were recorded by conventional two beam off-axis technique [28][29][30] these are shown in Fig. 3.…”

Section: Resultsmentioning

confidence: 99%

The Study of Electrodeposited PBS Thin Films Using Double Exposure Holography Interferometry Technique

Mane¹,

Dongare²,

ijrbat³

2015

IJRBAT

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The PbS thin films have been deposited by electrode position on stainless steel substrate and (CH3COO) 2 Pb and Na2S2O3 of an aqueous bath. The solutions of different normality were used with complexing agent EDTA. Double Exposure Holographic Interferometry (DEHI) technique is used for studying surface deformation of stainless steel substrate which was exposed for different intervals of time. It is observed that stress changes with concentrations. It is noticed that number of fringes goes on increasing with concentration. This effect is due to increase in thickness of PbS thin films deposited on stainless steel substrate. We have also measured the mass of deposited PbS thin films. These films were characterized and optimized by using optical absorption and X-ray diffraction technique.

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“…to 40sec. and holograms were recorded by conventional two beam off-axis technique [28][29][30] these are shown in Fig. 3.…”

Section: Resultsmentioning

confidence: 99%

The Study of Electrodeposited PBS Thin Films Using Double Exposure Holography Interferometry Technique

Mane¹,

Dongare²,

ijrbat³

2015

IJRBAT

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“…The properties of thin films depend upon their mechanical stability, which in turn is dependent on the intrinsic stresses developed during deposition. A simple non-destructive technique for the quantitative measurement of stress in thin films by way of this holographic technique has been reported by Magill et al [25]. While recording the hologram, if the sample is irradiated with a beam of lasers made at an angle of θ1 with the normal and slightly varied angle of θ2 during reconstruction, the reconstructed image has a superimposed fringe pattern corresponding to a displacement of the surface.…”

Section: Measurement Of Thickness Of the Thin Films And Stress To The...mentioning

confidence: 99%

Surface deformation studies of TiO₂ thin films by double exposure laser holographic interferometry

Arul¹,

Ramalingam²,

Balamurugan³

2023

Laser Phys.

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Double exposure laser holographic interferometry is implemented to investigate the surface deformation of an stainless steel (SS) 304 substrate during the deposition of titanium dioxide (TiO2) thin films on it. The TiO2 thin film is synthesized by the potentiostatic mode in the electrodeposition process. The in-situ analysis of the stress on the substrate and the thickness of the deposition is evaluated by non-destructive holographic interferometry. The holography interference fringes are computed and show that the TiO2 film thickness increases with an escalation in deposition time, but the stress on the substrate decreases.

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Mechanical Properties of Non-Metallic Thin Films

Hoffman

1976

Physics of Nonmetallic Thin Films

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Detection of Strain in Evaporated Films by Wavefront Reconstruction

Cited by 12 publications

References 0 publications

The Study of Electrodeposited PBS Thin Films Using Double Exposure Holography Interferometry Technique

The Study of Electrodeposited PBS Thin Films Using Double Exposure Holography Interferometry Technique

Surface deformation studies of TiO₂ thin films by double exposure laser holographic interferometry

Mechanical Properties of Non-Metallic Thin Films

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Detection of Strain in Evaporated Films by Wavefront Reconstruction

Cited by 12 publications

References 0 publications

The Study of Electrodeposited PBS Thin Films Using Double Exposure Holography Interferometry Technique

The Study of Electrodeposited PBS Thin Films Using Double Exposure Holography Interferometry Technique

Surface deformation studies of TiO2 thin films by double exposure laser holographic interferometry

Mechanical Properties of Non-Metallic Thin Films

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Surface deformation studies of TiO₂ thin films by double exposure laser holographic interferometry