2007
DOI: 10.1016/j.mee.2007.01.207
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Detection of magnetic field for measuring current distribution in metal nanostructure

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Cited by 5 publications
(4 citation statements)
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“…The MFM tip is coated with Al. In order to observe magnetic domain patterns, the tip trace the sample surface four times [14]. MFM imaging mode is based on tapping mode.…”
Section: Methodsmentioning
confidence: 99%
“…The MFM tip is coated with Al. In order to observe magnetic domain patterns, the tip trace the sample surface four times [14]. MFM imaging mode is based on tapping mode.…”
Section: Methodsmentioning
confidence: 99%
“…4 of Ref. 4). They attributed the observed small signals in the absence of current to an effect of surface topography, although they did not specify this effect exactly.…”
mentioning
confidence: 94%
“…Magnetic force microscopy (MFM) is often used for detecting stray magnetic fields near the surfaces of magnetic materials, [1][2][3] with a magnetized tip oscillating above the material. However, in their investigation of the currentinduced magnetic field from nonmagnetic metal lines, Tanaka et al 4 reported that MFM can detect small signals from nonmagnetic materials (see Fig. 4 of Ref.…”
mentioning
confidence: 99%
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