Detecting Defects in Photovoltaic Cells and Panels and Evaluating the Impact on Output Performances

Schuss, Christian; Leppänen, Kimmo; Remes, Kari; Saarela, Juha; Fabritius, Tapio; Eichberger, Bernd; Rahkonen, Timo

doi:10.1109/tim.2015.2508287

Cited by 44 publications

(41 citation statements)

References 22 publications

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“…Furthermore, measurements with the help of ST are carried out when PV cells are connected with each other and are protected by glass. Previous research has demonstrated that ST can be used to characterise crystalline PV cells and panels on top of the conductive layer and through glass [10]. In contrast to ST, other techniques such as ILIT, DLIT, PL and EL imaging focus on an earlier fabrication stage of the PV panel in which measurements can be made without glass encapsulation.…”

Section: Background Of the Research And Related Workmentioning

confidence: 99%

“…2. Here, an external power supply of 12 V and 1 A was applied to heat up the PV panels for 45 s in a dark, non-illuminated environment (λ = 0 W/m 2 ) [9], [10]. These ambient circumstances are comparable to dark lock-in thermography (DLIT) [20].…”

Section: A Measurement Setup and Measurement Samplementioning

confidence: 99%

“…We decided to use the same parameters (12 V supply voltage, 1 A current limit) for forward-biasing the encapsulated PV panels in order to obtain comparable results. To achieve this, we heated the PV panels for 45 seconds [3], [9], [10]. The temperature of an unheated reference sample was also measured with IR-imaging.…”

Section: B Obtaining and Analyzing Ir-imagesmentioning

confidence: 99%

“…6 show the differences in PV panel 3. For comparison, the IR-image obtained with the Flir b60 IR-camera is also shown [9], [10]. IR-imaging with the three different cameras was carried under the same conditions.…”

Section: B Obtaining and Analyzing Ir-imagesmentioning

confidence: 99%

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Detecting Defects in Photovoltaic Panels With the Help of Synchronized Thermography

Schuss

Remes

Leppänen

et al. 2018

IEEE Trans. Instrum. Meas.

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This paper investigates defects in photovoltaic (PV) panels, more precisely, the location of defects in PV panels. With the help of electrical verification, it is possible to verify the impact of defects on output performances. However, it is not possible to determine the location of defects in order to address the origin of problems, for example, in the manufacturing process of PV panels. In this paper, the focus lies on finding similarities in the location of defect areas in PV panels. Samples were characterised with the help of synchronized thermography (ST) and time-resolved thermography (TRT) in order to obtain infrared (IR) images of PV panels. IR-images are helpful to obtain a visual image on the health of PV panels, identify the position of defects and estimate the influence of defects on the output power. This information can be useful, for example, for improving the fabrication process of PV panels.

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Section: Background Of the Research And Related Workmentioning

confidence: 99%

Section: A Measurement Setup and Measurement Samplementioning

confidence: 99%

Section: B Obtaining and Analyzing Ir-imagesmentioning

confidence: 99%

Section: B Obtaining and Analyzing Ir-imagesmentioning

confidence: 99%

See 2 more Smart Citations

Detecting Defects in Photovoltaic Panels With the Help of Synchronized Thermography

Schuss

Remes

Leppänen

et al. 2018

IEEE Trans. Instrum. Meas.

Self Cite

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“…To obtain a precise correlation, great care was taken choosing the used temperature difference. The difference between mean temperatures or an equivalent yields results that show a correlation between module power and temperature, in contrast to, for example, the use of a difference between maximum temperatures …”

Section: Correlation Of Ir and Electrical Measurementsmentioning

confidence: 99%

Quantitative assessment of the power loss of silicon PV modules by IR thermography and its dependence on data‐filtering criteria

Teubner

Buerhop‐Lutz

Pickel

et al. 2019

Progress in Photovoltaics

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Reliability and quality control of photovoltaic (PV) plants increases in importance as the relevance of PV for the worldwide renewable energy production grows. In this study, a new method is presented which allows for a quantitative assessment of silicon PV module performance solely by relying on the cell temperatures measured via thermography (IR). A module temperature and power key figure are formulated and found to correlate very well with a linear relationship. The dependence of the deduced correlation's precision on measurement conditions is calculated and discussed. It facilitates decision‐making because optimal measurement conditions usually occur only very rarely, such that a compromise between data quality and measurement frequency has to be found. The power loss correlation presented in this paper may be used as part of a maintenance routine in order to ensure the best possible long‐term performance of the PV plant over its lifetime. The practical application in the field is outlined and explained.

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Defect Detection and Degradation Analysis in Photovoltaic Modules using Thermography, Spectroscopy, and Current–Voltage Measurements, and Quantitative Assessment of Their Impact

Akram

Jin

et al. 2020

Energy Tech

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The measurement of defects in photovoltaic (PV) module and their impact assessment can help to improve the reliability and performance of PV systems. Herein, improved defect detection and degradation analysis approach using the combination of infrared (IR) thermography, electroluminescence emission spectroscopy, and current–voltage (I–V) measurements are presented. Moreover, an image‐processing scheme to automatically detect and compute defective area is also proposed. First, experiments are conducted on normal operating modules. Subsequently, different defects and failures are induced, and experiments are conducted again. These modules are analyzed quantitatively and qualitatively. From IR images, defective area, overheating, and underheating computations are carried out. From I–V measurements, power losses, current degradation, and voltage degradation calculations are carried out. The defects that show up in IR images are correlated with I–V curve deviations and their effect on power losses and current/voltage degradation is also analyzed. Moreover, electroluminescence emissions of defective regions are correlated with overheating/underheating calculations. Finally, the observations from experimental results and related quantitative/qualitative computations are summarized. This approach can help to investigate module degradation stage and mode. It can also help in decision making with the use of only IR imaging and related computations in absence of optimum measurement conditions.

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Detecting Defects in Photovoltaic Cells and Panels and Evaluating the Impact on Output Performances

Cited by 44 publications

References 22 publications

Detecting Defects in Photovoltaic Panels With the Help of Synchronized Thermography

Detecting Defects in Photovoltaic Panels With the Help of Synchronized Thermography

Quantitative assessment of the power loss of silicon PV modules by IR thermography and its dependence on data‐filtering criteria

Defect Detection and Degradation Analysis in Photovoltaic Modules using Thermography, Spectroscopy, and Current–Voltage Measurements, and Quantitative Assessment of Their Impact

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