“…AC-(S)TEM has grown to be a powerful characterization platform for various types of materials [7,79,88,90,91,[107][108][109][110][111][112]. Due to the feasibility of obtained multiple images and spectra at the same time, AC-(S)TEM could provide a variety of capabilities for accurate atomic imaging and mapping of chemical and electronic structures [88,90,91].These techniques are indispensable to observing and adjusting for all defects at the atomic scale, and are therefore invaluable for materials research [88,89,91,92].…”