1992
DOI: 10.1049/el:19920532
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Design of ridge waveguide couplers with carrier injection using discrete spectral index method

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Cited by 12 publications
(2 citation statements)
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“…The Si film and buried oxide thicknesses correspond to the values of a multi-implanted SIMOX (supplied by SOITEC Grenoble). Thus, the twodimensional refractive index change profile could be determined using (14) and the effective index change is given by the following overlap integral obtained using a perturbation analysis [25]: (16) We have plotted on Fig. 6 the calculated effective index change for the fundamental mode as a function of the current density in the Si film layer.…”
Section: Effective Index Modulationmentioning
confidence: 99%
“…The Si film and buried oxide thicknesses correspond to the values of a multi-implanted SIMOX (supplied by SOITEC Grenoble). Thus, the twodimensional refractive index change profile could be determined using (14) and the effective index change is given by the following overlap integral obtained using a perturbation analysis [25]: (16) We have plotted on Fig. 6 the calculated effective index change for the fundamental mode as a function of the current density in the Si film layer.…”
Section: Effective Index Modulationmentioning
confidence: 99%
“…Such parameters are necessarily device dependent, and for the distributed feedback (DFB) rib laser diode chosen for study here, quantum well filling factor r and grating coupling to the design of any DFB laser diode, and similarly modeprofile-dependent parameters can be found when calculating modes for other optical devices. Using and K as well as nmode as the metric, it will be shown that the SIM combines the speed and simplicity of a semianalytical technique with the accuracy of a numerical technique into a method that is a powerful tool for designing laser diodes, channel dropping filters [15], and other complex rib waveguide devices [16].…”
Section: Introductionmentioning
confidence: 99%