1993
DOI: 10.1007/bf00430186
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Planar waveguide analysis by the spectral index method. I: Rib and uniformly buried waveguides

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Cited by 10 publications
(2 citation statements)
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“…Numerical simulation has been widely used in the design optimization of optoelectronic devices, since it can save tremendous labor and cost before fabrication. Many of these simulations are performed in the frequency domain, for example using a numerical approach such as the Finite Difference Beam Propagation Method (FD BPM), [1][2][3], or a semi-analytic approach such as the Spectral Index (SI) Method, [4][5]. These methods obtain the continuous wave (CW) response of the device for a fixed frequency, and may make physically consistent approximations for a particular class of device.…”
Section: Introductionmentioning
confidence: 99%
“…Numerical simulation has been widely used in the design optimization of optoelectronic devices, since it can save tremendous labor and cost before fabrication. Many of these simulations are performed in the frequency domain, for example using a numerical approach such as the Finite Difference Beam Propagation Method (FD BPM), [1][2][3], or a semi-analytic approach such as the Spectral Index (SI) Method, [4][5]. These methods obtain the continuous wave (CW) response of the device for a fixed frequency, and may make physically consistent approximations for a particular class of device.…”
Section: Introductionmentioning
confidence: 99%
“…The refractive-index profile of the waveguide is characterized by three relative index heights L = (n -n)/2n for i = 2,3,4. To search for the zero-birefringence conditions for this waveguide, we apply the spectral index method developed for multi-layer structures 18. To reduce the number of variables, we assume L2 = 0.01 and = 0.45, which are typical values for air-clad semiconductor waveguides.…”
mentioning
confidence: 99%